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chroma ate inc (2360) Details

Chroma ATE Inc. designs, assembles, calibrates, manufactures, sells, repairs and maintains software/hardware for computers and peripherals, computerized automatic test systems, electronic test instruments, signal generators, power supplies, and telecom power supplies worldwide. It provides video and color test solutions, such as video pattern generators, color analyzers, automatic test systems, and digital power meters; flat panel display test solutions, including OLED test systems, display testing solutions, and 8K SHV testing solutions; electrical safety testing solution; and LED/lighting and driver test solutions. It also offers optical devices test solutions; photovoltaic/inverter test and automation solutions; automated optical inspection solutions; power electronics test solutions; electric vehicle test solutions; battery test and automation solutions; passive component, electrical safety, and semiconductor/IC test solutions; PXI test and measurement solutions; and intelligent manufacturing systems solutions. In addition, it offers warranty, calibration and repair, instrument and test system calibration and repair, customer-site installations, product upgrade, replacement parts, training, technical support, and product support services. Its products are used in clean technology test solutions, aerospace/military, automotive/electric vehicle (EV), battery testing, LED/lighting, solar, power efficiency testing, UPS/power supply, and medical applications. Chroma ATE Inc. was founded in 1984 and is headquartered in Taoyuan, Taiwan.

Founded in 1984

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Chroma Launches New Test Solutions, The Chroma 3680

Chroma ATE Inc. will present its newest semiconductor test solutions in SEMICON China in March to snatch the IoT and smart vehicle electronics chips market. The Chroma 3680 is an advanced, high-precision and high-performance SoC test system that has 2048 I/O channels with a data rate up to 1Gbps, maximum 512 paralleled test units and a 512MW test data memory depth to satisfy the complex SoC testing requirements with the lowest cost of tests. Its application includes MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer IC electronics. The HDAVO (High Density Audio Video Option) is an option of the 3680 SoC test system that has 8 modules of arbitrary waveform generators (AWG) and digitizers (DGT). The sampling rate is up to 400Msps for each AWG and 250Msps for each DGT. The advantages of superior specification, low cost and multi-functionality make it suitable for a wide range of mixed signals tests such as standard baseband, video, audio, graphics, STB and DTV. The CRISPro software kit specifically developed for the 3680 test system allows the users to edit the test programs quickly and easily via a Graphic User Interface (GUI). The supported concurrent testing function not only reduces the test time but also accelerates the throughput of production speed. The Chroma 33010 PXIe Digital IO Card provides automatic test functions based on PXIe architecture to meet the coming demand of PXI testing. To satisfy smaller IC channels and increasingly complex test functions, especially on IoT and automotive electronics IC, the PXI/PXIe architecture in semiconductor testing offers certain advantages in an application's diversity and flexibility, which includes MCU, MEMS, RF IC and PMIC testing. It is also feasible for porting to Chroma 3380D (256 channels), Chroma 3380P (512 channels) and Chroma 3380 (1280 channels) for mass-production as they have high compatibility in both software and hardware. The Chroma 3200L-6 optical fiber DC/RF test system mainly used for detecting the DC and RF of a box packaged optical spectrum analyzer (OSA) is equipped with functions of optical fiber automated cleaning and testing, optical fiber visual positioning and automated swapping, probe visual positioning and contact control. Its probing repeatability is up to ± 40um. With the support of single-station for engineering experiments and an entire line for mass production, the test system increases the implementation flexibility and significantly reduces the labor and loss cost of testing. The Chroma semiconductor test equipment integrating with the MP5800 RF ATE tester can cover 6GHz test range and provide 4/8 RF port with 120MHz bandwidth. Its application includes Wi-Fi, BT, GNSS/NB-IoT/LoRa, other IoT connectivity ICs and RF components (PA/LNA/Converter, etc.) to meet the requirements of a total RF/Digital ATE (CP/FT/SLT) test solution. The 2018 SEMICON China will be held from March 14 to 16, and Chroma ATE Inc. will show the newest semiconductor test solution at the Shanghai New International Expo Center (SNIEC) (Booth No. 3165). Guests are invited to experience new trends in testing and measurement.

Chroma Ate Inc. Announces Consolidated Earnings Results and Parent Sales Results for Fourth Quarter and Full Fiscal Year Ended December 31, 2017

Chroma Ate Inc. announced consolidated earnings results and parent sales results for fourth quarter and full fiscal year ended December 31, 2017. For the fourth quarter, consolidated sales revenues were TWD 5.2 billion. Parent sales revenues reached TWD 2 billion, a decline of 10% quarter on quarter but a growth of 27% year on year. Net income reached TWD 888 million, represented a growth of 3% quarter on quarter and 132% year on year, with diluted earnings per share of TWD 2.11. For the fiscal year 2017, the company achieved consolidated sales revenues of TWD 14.9 billion, increased by 28% year on year and parent sales Revenue was TWD 8 billion, presented a growth of 11%. The net profit was TWD 2.6 billion, represented a strong growth of 49% compared to TWD 1.7 billion in year 2016, with diluted earnings per share of TWD 6.18.

Chroma ATE Inc. Proposes Amendments to Articles of Incorporation

Chroma ATE Inc. proposed amendments to Articles of Incorporation in its Annual Shareholders Meeting to be held on June 8, 2018.


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