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Company Description

Contact Info

600 Riverpark Drive

North Reading, MA 01864

United States

Phone: 978-370-2700


Teradyne, Inc. operates as a supplier of automatic equipment for test and industrial applications worldwide. The company designs, develops, manufactures, and sells automatic test systems used to test semiconductors, wireless products, data storage and complex electronics systems in the consumer electronics, wireless, automotive, industrial, computing, communications, and aerospace and defense industries. The company’s industrial automation products include collaborative robots used by global manufacturing and light industrial customers. Its automatic test equipment and industrial automation products and services include semiconductor test (Semiconductor Test) systems; defense/aerospace (Defense/Aerospace) test instrumentation and systems, storage test (Storage Test) systems, and circuit-board test and inspection (Production Board Test) systems (collectively these products represent System Test); wireless test (Wireless Test) systems; and industrial automation (Industrial Automation) products. The company has a customer base, which includes integrated device manufacturers (IDMs), outsourced semiconductor assembly and test providers (OSATs), wafer foundries, fabless companies that design, but contract with others for the manufacture of integrated circuits (ICs), developers of wireless devices and consumer electronics, manufacturers of circuit boards, automotive suppliers, wireless product manufacturers, storage device manufacturers, aerospace and military contractors, and distributors that sell collaborative robots. Segments Semiconductor Test This segment provides test systems that are used both for wafer level and device package testing. These chips are used in automotive, industrial, communications, consumer, and computer and electronic game applications, among others. Semiconductor devices span a range of functionality, from very simple low-cost devices, such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors, as well as memory devices. Semiconductor Test products and services are sold to IDMs that integrate the fabrication of silicon wafers into their business, Fabless companies that outsource the manufacturing of silicon wafers, Foundries that cater to the processing and manufacturing of silicon wafers, and OSATs that provide test and assembly services for the final packaged devices to both Fabless companies and IDMs. Fabless companies perform the design of integrated circuits without manufacturing capabilities, and use Foundries for wafer manufacturing and OSATs for test and assembly. The company’s FLEX Test Platform architecture advances its core technologies to produce test equipment that is designed for multi-site testing. Multi-site testing involves the simultaneous testing of many devices in parallel. The FLEX Test Platform architecture addresses customer requirements through various key capabilities, such as a multi-site architecture that reduces tester overhead, such as instrument setup, synchronization and data movement, and signal processing; the IG-XL software operating system, which provides program development, including instant conversion from single to multi-site test; and broad technology coverage by instruments designed to cover the range of test parameters, coupled with a universal slot test head design that allows easy test system reconfiguration to address changing test needs. FLEX Test Platform purchases are being made by IDMs, OSATs, Foundries and Fabless customers. The FLEX Test Platform has become a widely used test solution at OSATs by providing testers that could handle the range of devices, allowing OSATs to leverage their capital investments. The UltraFLEX-M tester extends the FLEX Test Platform into the High Speed DRAM testing market. The FLEX Test Platform has an installed base of approximately 4,700 systems. The company’s J750 test system shares the IG-XL software environment with the family of FLEX Test Platform systems. The J750 is designed to address the highest volume semiconductor devices, such as microcontrollers, that are central to the functionality of almost every consume


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