Bloomberg the Company & Products

Bloomberg Anywhere Login

Bloomberg

Connecting decision makers to a dynamic network of information, people and ideas, Bloomberg quickly and accurately delivers business and financial information, news and insight around the world.

Company

Financial Products

Enterprise Products

Media

Customer Support

  • Americas

    +1 212 318 2000

  • Europe, Middle East, & Africa

    +44 20 7330 7500

  • Asia Pacific

    +65 6212 1000

Communications

Industry Products

Media Services

Follow Us


Last $2.31 USD
Change Today +0.09 / 4.05%
Volume 4.3K
AEHR On Other Exchanges
Symbol
Exchange
Berlin
NASDAQ CM
As of 8:10 PM 04/17/15 All times are local (Market data is delayed by at least 15 minutes).
text size: T | T
Back to Snapshot
Company Description

Contact Info

400 Kato Terrace

Fremont, CA 94539

United States

Phone: 510-623-9400

Fax: 510-623-9450

Aehr Test Systems develops, manufactures, and sells systems which are designed to reduce the cost of testing and to perform reliability screening, or burn-in, of complex logic and memory devices. These systems can be used to simultaneously perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die, or ICs still in wafer form. Products The company manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures, die carriers and related accessories. All of the company’s systems are modular, allowing them to be configured with optional features to meet customer requirements. Full Wafer Contact Systems The FOX-1 full wafer parallel test system, introduced in 2005, is designed for massively parallel test in wafer sort. The FOX-1 system is designed to make electrical contact to and test all of the die on a wafer in a single touchdown. The FOX-1 pattern generator is designed to functionally test industry-standard memory, such as flash and DRAMs, plus it is optimized to test memory or logic ICs that incorporate design for testability (DFT), and built-in self-test (BIST). The FOX-1 pin electronics and per-device power supplies are modified to full-wafer functional test. The FOX-15 full wafer contact test and burn-in system, introduced in 2007, is designed for use with wafers that require test and burn-in times typically measured in hours. The FOX-15 is focused on parallel testing and burning-in up to 15 wafers at a time. One of the main components of the FOX systems is the patented WaferPak cartridge system. The WaferPak cartridge contains a full-wafer single-touchdown probe card which is easily removable from the system. Traditional probe cards contact only a portion of the wafer, requiring multiple touchdowns to test the entire wafer. Systems for Packaged Parts Test during burn-in (TDBI) systems consist of several subsystems: pattern generation and test electronics, control software, network interface and environmental chamber. The test pattern generator allows duplication of most of the functional tests performed by a traditional tester. Pin electronics at each burn-in board (BIB) position are designed to provide signals to the ICs being tested and detect whether a device is failing the test. Devices being tested are placed on BIBs and loaded into environmental chambers which operate at temperatures from 25 degrees Celsius (77 degrees Fahrenheit) up to 150 degrees Celsius (302 degrees Fahrenheit) (optional chambers can produce temperatures as low as -55 degrees Celsius (-67 degrees Fahrenheit)). The Advanced Burn-in and Test System (ABTS) was introduced in 2008. The ABTS family of products is based on a completely new hardware and software architecture that is intended to address devices. The ABTS system can test and burn-in both high-power logic and low-power ICs. It can be configured to provide individual device temperature control for devices up to 70W or more and with up to 320 I/O channels. The MAX system family was designed for monitored burn-in of memory and logic devices. It has 96 channels and holds 64 burn-in boards, each of which hold up to 350 or more devices, resulting in a system capacity of up to 22,400 or more devices. The output monitor feature allows the MAX system to perform functional tests of devices and it also supports BIST or other scan features. The MAX4 extends the MAX system family to target devices that require higher current, and can provide up to 227 amps of per BIB position. Test Fixtures The company sells, and licenses others to manufacture and sell, custom-designed test fixtures for its systems. The test fixtures include BIBs for the ABTS parallel test and burn-in system and for the MAX monitored burn-in system. These test fixtures hold the devices undergoing test or burn-in and electrically connect the devices under test to the system electronics. Test fixtures are sold both with new Aehr Test systems and for use with the company’s installed base of systems. Test fixtures are also available from third-party suppliers. The company’s DiePak product line includes a family of reusable, t

Page 12Next Page
 

Stock Quotes

Market data is delayed at least 15 minutes.

Company Lookup
Recently Viewed
AEHR:US $2.31 USD +0.09

AEHR Competitors

Market data is delayed at least 15 minutes.

Company Last Change
Cascade Microtech Inc $13.42 USD -0.27
Japan Electronic Materials Corp ¥808.00 JPY -18.00
soulbrain ENG Co Ltd 1,245 KRW +15.00
TSE Co Ltd 17,650 KRW +750.00
UniTest Inc 12,650 KRW +150.00
View Industry Companies
 

Industry Analysis

AEHR

Industry Average

Valuation AEHR Industry Range
Price/Earnings NM Not Meaningful
Price/Sales 2.1x
Price/Book 4.7x
Price/Cash Flow NM Not Meaningful
TEV/Sales 1.9x
 | 

Sponsored Financial Commentaries

Sponsored Links

Report Data Issue

To contact AEHR TEST SYSTEMS, please visit www.aehr.com. Company data is provided by Capital IQ. Please use this form to report any data issues.

Please enter your information in the following field(s):
Update Needed*

All data changes require verification from public sources. Please include the correct value or values and a source where we can verify.

Your requested update has been submitted

Our data partners will research the update request and update the information on this page if necessary. Research and follow-up could take several weeks. If you have questions, you can contact them at bwwebmaster@businessweek.com.