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03/21/14 - $19.44
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nanometrics inc (NANO) Details

Nanometrics Incorporated provides high-performance process control metrology and inspection systems used primarily in the fabrication of integrated circuits, high-brightness LEDs, discrete components, and data storage devices in the United States, Japan, South Korea, and internationally. It offers automated metrology systems that provide optical critical dimension, thin film metrology, and wafer stress for transistor and interconnect metrology applications; and the Lynx platform enables cluster metrology factory automation for wafer metrology applications, such as optical critical dimension metrology and thin film process control. The company's automated and integrated systems are also used in various process control applications, including dimension and film thickness measurement, device topography, defect inspection, and overlay registration, as well as used in the analysis of various other film properties, such as optical, electrical, and material characteristics. Its process control solutions are deployed in the fabrication process from front-end-of-line substrate manufacturing to high-volume production of semiconductors and other devices, as well as to wafer-scale packaging applications. The company sells its metrology and inspection systems directly and through original equipment manufacturer channels to semiconductor manufacturers and equipment suppliers, and producers of high-brightness-LEDs, solar photovoltaics, data storage devices, silicon wafers, and photomasks. Nanometrics Incorporated was founded in 1975 and is headquartered in Milpitas, California.

536 Employees
Last Reported Date: 03/7/14
Founded in 1975

nanometrics inc (NANO) Top Compensated Officers

Chief Executive Officer, President and Direct...
Total Annual Compensation: $465.0K
Compensation as of Fiscal Year 2013.

nanometrics inc (NANO) Key Developments

Nanometrics Unveils New Imperia PL System for Semiconductor Manufacturing

Nanometrics Incorporated has announced the launch of Imperia, its new photoluminescence, or PL, system, for advanced compound semiconductor manufacturing. The Imperia is a fully automated non-contact optical system offering comprehensive metrology and inspection for high brightness light emitting diode (HB-LED) manufacturing applications. The system enables rapid simultaneous PL measurement and defect inspection. With its advanced software capabilities, the Imperia provides critical defect analysis, classification and yield prediction for critical steps in substrate, epitaxial junction formation, and interconnect processes.

Nanometrics Incorporated Presents at 17th Annual Needham Growth Conference, Jan-15-2015 02:10 PM

Nanometrics Incorporated Presents at 17th Annual Needham Growth Conference, Jan-15-2015 02:10 PM. Venue: New York Palace Hotel, 455 Madison Avenue, New York, New York, United States.

Nanometrics Incorporated Announces the Launch of its NanoSpec II Standalone Metrology System

Nanometrics Incorporated announced the launch of its NanoSpec II standalone metrology system, the latest model in its NanoSpec line of economic film metrology systems. With a streamlined design based on the long-proven NanoSpec tabletop architecture, the NanoSpec II standalone is a fully automated non-contact optical metrology system for advanced material characterization on substrates up to 200mm. For films analysis, the NanoSpec II enables process control metrology and characterization on full-stack, multi-layer films and optical constant variation monitoring. New system hardware and software enhancements make the NanoSpec II the industry's most powerful and cost-effective film metrology system in its class, ideally suited for industrial and research environments.


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