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Last $2.03 USD
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aehr test systems (AEHR) Snapshot

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07/18/14 - $3.24
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10/10/14 - $1.80
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aehr test systems (AEHR) Details

Aehr Test Systems designs, engineers, develops, manufactures, and sells test and burn-in equipment used in the semiconductor industry worldwide. Its systems are used to simultaneously perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die, or ICs still in wafer form. The company offers Advanced Burn-In and Test System that tests and burn-in high-power logic and low-power ICs; FOX full wafer contact parallel test and burn-in systems designed to make contact with all pads of a wafer simultaneously, thus enabling full wafer parallel test and burn-in; and MAX burn-in system designed for monitored burn-in of memory and logic devices. It products also comprise WaferPak full wafer contactor, a cartridge system that includes a full-wafer probe card for use in testing wafers in FOX systems; DiePak carrier, a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of singulated bare die; and test fixtures that hold the devices undergoing test or burn-in and electrically connect the devices under test to the system electronics. In addition, the company offers customer service and support programs, including system installation, system repair, applications engineering support, spare parts inventories, customer training, and documentation. It markets and sells its products to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers, and burn-in and test service companies through a network of distributors and sales representatives. The company was founded in 1977 and is headquartered in Fremont, California.

76 Employees
Last Reported Date: 08/28/14
Founded in 1977

aehr test systems (AEHR) Top Compensated Officers

Chief Executive Officer, President and Direct...
Total Annual Compensation: $235.1K
Chief Financial Officer, Principal Accounting...
Total Annual Compensation: $180.5K
President of Aehr Test Systems Japan K.K.
Total Annual Compensation: $167.4K
Vice President of Engineering
Total Annual Compensation: $231.0K
Vice President of Worldwide Sales
Total Annual Compensation: $202.6K
Compensation as of Fiscal Year 2014.

aehr test systems (AEHR) Key Developments

Aehr Test Systems Receives $1.7 Million Follow-On Order for its Advanced Burn-In and Test Systems

Aehr Test Systems said it has received a $1.7 million follow-on order for its Advanced Burn-in and Test Systems (ABTS) from a leading multi-national manufacturer of advanced logic integrated circuits (ICs) for automotive, embedded processing, digital signal processing and analog applications. The order includes prepayments in order to lock in short lead times and special pricing, and the systems are expected to ship within the next six months.

Aehr Test Systems Receives Order for ABTS Burn-In and Test System in China

Aehr Test Systems has received an order from a new customer in China for shipment of an ABTS burn-in and test system for high temperature operating life, or HTOL, testing of devices for reliability characterization. The system is expected to ship within the next month. Aehr Test has now been selected by eight customers in China to perform their HTOL and burn-in processes with advanced ABTS burn-in and test platform. High-temperature operating life is a reliability test applied to integrated circuits to determine their intrinsic reliability in which the devices are subjected to temperatures as high as 150C for extended periods of time. In typical HTOL reliability tests, failure mechanisms are accelerated by burning-in the devices for 1,000 hours to confirm that the basic design and fabrication process of a device will meet the reliability targets over an extended period of normal use. The ABTS family of products is based on a new hardware and software platform that is designed to address not only devices, but also future devices for many years to come. It can test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. ABTS systems can be configured with up to 72 burn-in boards, up to 320 I/O channels, 32M of test vector memory per channel and up to 16 independent device power supplies. The ABTS system is optimized for use with the Sensata iSocket Thermal Management Technology, which provides a scalable cost-effective solution using individual device temperature control for up to 64 devices per burn-in board and up to 75 watts per device or more. Individual temperature control enables high-power devices with a broad range of power dissipation to be burned-in simultaneously in a single burn-in chamber while maintaining a precise device temperature. The ABTS system also uses N+1 redundancy technology for many key components in the system to maximize system uptime.

Aehr Test Systems Announces Follow-On Order for FOX-15(TM) WaferPak(TM) Contactors

Aehr Test Systems announced it has received over $700,000 in follow-on orders for WaferPak full-wafer contactors for its FOX-15™ multi-wafer burn-in and test system from supplier of automotive and industrial integrated circuits. The WaferPak contactors are expected to ship within the next four to six months.


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