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advantest corp (6857) Details

Advantest Corporation manufactures and sells semiconductor and component test system products and mechatronics-related products. It operates through Semiconductor and Component Test System; Mechatronics System; and Services, Support and Others segments. The Semiconductor and Component Test System segment provides customers with test system products for the semiconductor industry and the electronic parts industry. This segment offers test systems for SoC semiconductors for use in non-memory semiconductor devices; and test systems for memory semiconductors for use in memory semiconductor devices. The Mechatronics System segment provides test handlers; mechatronic-applied products for handling semiconductor devices; and device interfaces, which serve as interfaces with the devices that are measured. This segment also engages in the operations related to nano-technology products. The Services, Support and Others segment provides customer solutions for the semiconductor and component test system and mechatronics system segments; and support services. This segment is also involved in the equipment lease business and others. In addition, the company engages in research and development activities measuring and testing technologies; and sale of used products. Advantest Corporation serves fabless semiconductor companies, foundries, and test houses, as well as industrial, design, and manufacturing companies in Japan, Korea, the People's Republic of China, Taiwan, Singapore, the Americas, and Europe. The company was founded in 1954 and is headquartered in Tokyo, Japan.

Founded in 1954

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advantest corp
Advantest Corporation Introduces New T5822 System for Cost-Efficient, Wafer-Level Testing of Mixed Semiconductor Memories

Advantest Corporation has launched the T5822 memory tester, the newest member of its T5800 product series, optimized for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. With mobile applications booming, semiconductor manufacturers need low-cost solutions for high-volume testing of a wide range of price-sensitive memory ICs. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps). The new tester offers high-voltage resources such a level driver and DC testing capability along with an economical compact test head. It also features a powerful memory repair analysis (MRA) capability to help customers maximize their yields. Using Advantest’s FutureSuite operating system, the system is compatible with test programs for a wide range of memory devices. With output voltages from -10 volts to 13 volts, it provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices. In addition, the T5822 has the same modular architecture as its predecessors, providing users with a seamless transition from any other T5800 series tester.

Advantest Corporation Introduces Wave Scale MX Channel Card

Advantest Corporation has added a high-resolution, highly accurate mixed-signal channel card to its Wave Scale MX product family, extending the series’ range in testing analog-to-digital and digital-to-analog waveform converters. The new Wave Scale MX high-resolution card combines the higher parallel testing capability with the most reliable AC and DC performance. These attributes allow Advantest’s V93000 test platform to meet the increasing low-distortion, accuracy and linearity requirements in testing analog and digital waveform converters while also helping to reduce the cost of test and time to market for consumer audio and IoT devices. The card provides high performance and fully independent AC and DC testing across as many as 32 instruments – 16 arbitrary waveform generators (AWGs) and 16 digitizers – for either single-ended or differential signals. It has local, temperature-controlled references that ensure the highest DC stability over time, and single-ended signals can be referenced to a ground sense per channel to achieve the highest fidelity. An additional parametric measurement unit (PMU) at each pogo ensures highly accurate DC measurements. The card also can handle swings of up to 20 Vpp for single-ended signals and 40 Vpp for differential signals. All functions are controlled by Testprocessor software to maximize throughput and repeatability. The innovative architecture of Wave Scale MX cards enables simultaneous testing on all 32 instruments with totally different settings as there are no shared resources. The resulting in-site parallelism and high multi-site efficiency significantly reduces the cost of test for complex mixed-signal devices. In addition to a card with exclusively high-resolution resources, Advantest also is introducing a Wave Scale MX hybrid card that combines high-resolution and high-speed functions on a single card. The company is now accepting orders for its high-resolution and hybrid Wave Scale MX cards.

Advantest Corporation Ships 5,000th V93000 System to Integrated Device Technology Inc

Advantest Corporation has shipped its 5,000th V93000 test system to Integrated Device Technology Inc. (IDT). The recently installed system is equipped with the new DC Scale AVI64 universal analog pin card, Pin Scale 1600 digital cards and DC Scale DPS128 cards to meet IDT’s needs in new product markets. A member of Advantest’s versatile V93000 series of testers, the AVI64 module provides greater flexibility and scalability that enables unprecedented asset utilization, manufacturing flexibility and the lowest cost of test. The AVI64 is architecturally advanced compared to current market offerings, integrating on a single card 64 independent channels with multiple functions including precision DC source and measure, pulsed power capabilities, arbitrary waveform generators and digitizers, high-voltage digital I/O and time measurement capabilities. Traditional ATE solutions have been using multiple types of cards with much lower channel counts per card, limiting the ability to perform multi-site testing. The AVI64 delivers twice the parallel test count while significantly simplifying loadboard designs by reducing the need for relays. As a result, test times have been shortened and the cost of test has been reduced by as much as 50% compared to incumbent solutions.

 

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Valuation 6857 Industry Range
Price/Earnings 28.5x
Price/Sales 2.4x
Price/Book 3.4x
Price/Cash Flow 29.4x
TEV/Sales 1.8x
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