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November 29, 2015 2:45 PM ET


Company Overview of Galaxy Semiconductor Solutions

Company Overview

Galaxy Semiconductor Solutions provides test data analysis, yield management, and defect reduction software solutions for the semiconductor industry. It offers Examinator, which enables device characterization, production monitoring, and yield analysis studies from standard semiconductor data files; PAT-MAN, a solution for part average testing and defects per million (DPM) reduction techniques; and Yield-MAN, a yield management solution that enables to automate the management of production test yield data. The company also provides Audit, a software tool that enables the optimization of test program execution speed; and Optimizer, which enhances the tester throughput. Its products are used i...

Galway Technology Centre

Suite 20

Mervue Business Park



Founded in 1987


353 9 144 2083


353 1 633 5008

Key Executives for Galaxy Semiconductor Solutions

Chief Operating Officer
Compensation as of Fiscal Year 2015.

Galaxy Semiconductor Solutions Key Developments

Teradyne Enters into OEM Agreement for Real-Time and Offline Test Data Analysis with Galaxy

Teradyne Inc. and Galaxy Semiconductor Solutions announced they have entered into an OEM agreement to provide an integrated, advanced analysis capability for Teradyne's entire line of semiconductor test equipment. Under the terms of the agreement, Teradyne will integrate special versions of Galaxy's Examinator and Examinator-Pro software as an option to its Semiconductor Test platforms. Teradyne's worldwide applications engineering team will also use Examinator to provide customers with acceptance testing, characterization and tester correlation studies to accelerate release-to-production and shorten the time-to-market of new semiconductor devices. Teradyne and Galaxy engineering teams are collaborating on a new real-time viewer (RTV) capability that will provide test engineers with live histograms, box-plots and Pareto charts displayed as devices are tested. This functionality will enable a highly interactive user experience during initial silicon debug and help improve engineering productivity while minimizing the need for tester time. The RTV is based on the emerging CAST (Collaborative Alliance for Semiconductor Test) standard interface for real-time test events, which is currently in the standardization process at the SEMI organization. RTV will be demonstrated at the Teradyne User's Group Conference in Orlando on May 4-6.

Galaxy Semiconductor Solutions Enters into Licensing Agreement with Skyworks Solutions, Inc

Galaxy Semiconductor Solutions announced that it has entered into a licensing agreement with Skyworks Solutions Inc. for Galaxy's entire product suite including PAT-Man™, Yield-Man™ and Examinator™ software. Galaxy's PAT-Man™ solution will serve as a key component of Skyworks' zero-defect program in manufacturing, aimed primarily at high reliability wireless and automotive applications. PAT-Man™ enables Skyworks to broaden the deployment of a Part Average Testing (PAT) process across its entire wafer probe and final test operations. PAT is the process of "outlier" detection and removal whereby parts that are within specification but outside of the normal distribution of test results are culled from production shipments. The Automotive Electronics Council (AEC) has promoted PAT over the past several years based on industry data that has shown that outliers have significantly higher failure rates over time. Galaxy's PAT-Man™, coupled with its Yield-Man™ database and Examinator viewer, represent a comprehensive software solution for Parts Average Testing (PAT) and related DPM reduction techniques, and manages the entire PAT process from initial wafer lot characterization to final-test yield monitoring. PAT-Man™ employs an intelligent outlier removal process, which helps improve device quality while minimizing unnecessary yield loss. PAT-Man™ is also tightly integrated with Galaxy Yield-Man, a scalable, enterprise yield management solution that helps optimize manufacturing and test processes.

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