Electronic Equipment, Instruments and Components
Company Overview of MicroSense, LLC
MicroSense, LLC designs, manufactures, and supports capacitive position sensors, metrology modules, and magnetic metrology tools. The company offers precision capacitive position sensors; MicroSense PV-6060, a metrology module for the measurement of solar wafer thickness, wafer total thickness variation, and wafer resistivity; and vibrating sample magnetometers that are used in measuring magnetic moment and coercivity of thin films or studying the magnetic properties of liquids, powders, or bulk samples. It also provides various services, such as calibration, repair, and information on product support. MicroSense, LLC serves data storage, machine tool, solar, semiconductor, and automotive in...
205 Industrial Avenue East
Lowell, MA 01852
Founded in 1967
Key Executives for MicroSense, LLC
Chairman and Chief Executive Officer
Compensation as of Fiscal Year 2014.
MicroSense, LLC Key Developments
MicroSense Ships Novel Led Sapphire Wafer Measurement Tools for Process Control
Jun 12 14
MicroSense, LLC announced multiple shipments of its new, next-generation automated sapphire wafer metrology tool, the MicroSense UltraMap C200. Designed specifically for high throughput dimensional measurement of sapphire wafers for LED manufacturing, the UltraMap C200 provides throughput of ninety 6" diameter sapphire wafers per hour with lowest cost of ownership (CoO). The UltraMap C200 utilizes MicroSense's novel two sided capacitive sensing technology to measure sapphire wafer geometry including thickness, TTV (total thickness variation), bow, warp, and LTV (local site thickness variation). The UltraMap C200 is available in three versions including tools with robotic loading, robotic loading with cassette sorting and a bench top tool. The UltraMap C200 handles wafers ranging from 2" to 8" in diameter.
MicroSense, LLC Delivers Suite of STT-MRAM Magnetic Metrology Systems
Jan 14 14
MicroSense, LLC announced installation of a full suite of STT-MRAM magnetic metrology tools at a leading edge semiconductor manufacturer. These metrology systems characterize the magnetic properties of multi-layer 300 mm wafers or coupons used in the development and manufacturing of Perpendicular and In-Plane STT-MRAM (Spin-Transfer-Torque Magneto-resistive Random Access Memory).
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