Electronic Equipment, Instruments and Components
Company Overview of Presto Engineering, Inc.
Presto Engineering, Inc. provides semiconductor product engineering and production solutions to integrated device manufacturers, fables, and electronics companies. It offers radio-frequency and mixed-signal solutions; and manufacturing, fab/assembly and test, consulting/audit, and training solutions. The company also provides engineering services, such as testing, electrostatic discharge testing, qualification/reliability, failure analysis, and high-definition multimedia interface/HDCP compliancy testing services. In addition, the company offers custom hardware solutions, such as test solutions that include test program (software) development, as well as hardware interface; reliability board...
109 Bonaventura Drive
San Jose, CA 95134
Founded in 2006
Key Executives for Presto Engineering, Inc.
Co-Founder and Vice President of Engineering
Vice President of Research & Development
Compensation as of Fiscal Year 2014.
Presto Engineering, Inc. Key Developments
Presto Engineering, Inc. Adds New Radio Frequency Device Testing Equipment to its Caen
Sep 2 14
Presto Engineering, Inc. announced that is has tripled the capacity of its engineering hub, and has added new RF (radio frequency) device testing equipment to its Caen, France-based hub. As a result, the company is in full-expansion mode as it move to support this growth with aggressive investments in additional capacity. Many of North American and European customers need to have testing and back-end support services close to them, rather than in Asia, for example, so that they can stay intimately involved with the development and ramp of these very complex, high-frequency devices.
Presto Engineering, Inc. Expands RF Capacity
Sep 2 14
Presto Engineering, Inc. announced that is has tripled the capacity of its San Jose, Calif.-based engineering hub, and has added new RF (radio frequency) device testing equipment to its Caen, France-based hub. Presto's Caen, France hub will support all aspects of RF, as well as analog and mixed signal devices. The Caen hub is the only back-end service house in Europe with 12-inch wafer probe capabilities coupled with the most advanced RF automated test equipment (ATE) in the market. Presto's San Jose hub will focus on high-frequency RF testing at millimeter wavelengths. Both operations will leverage Presto's RF, high-speed analog and mixed signal test know-how developed in the past five years and resulting in highly optimized, cost-effective solutions.
Presto Engineering and DelfMEMS Collaborate to Design Ultra Fast RF MEMS Test Solution
Jan 30 14
Presto Engineering, Inc. and DelfMEMS announced that they have worked together to design, from specification to integration, the first full PXI-based test system for ultra-fast characterization testing of radio frequency (RF) micro-electro-mechanical-systems (MEMS). The PXI-based test cell significantly reduces total cost-of-ownership and speeds time-to-volume and yield optimization compared to currently prevailing test methods. Standard RF wafer probing approaches on automatic test equipment (ATE) are not cost-effective for device characterization during a ramp phase. Because of their high capital cost, ATE is best suited for high-volume production. Increasing throughput via parallel testing (several sites tested simultaneously) can reduce costs. This is especially true for the extremely low-cost, high-volume devices, such as RF MEMS for mobile phones. Characterization testing of these devices during the ramp phase, using either an ATE or bench test system, is, respectively, too expensive or too slow to meet the time-to-volume objective. The new test bench enables intensive device characterization during ramp-up phase by using an industrial solution capable of volume test production. It has been designed has a versatile measurement platform in order to fully characterize, both in the time-domain and frequency-domain, various RF-MEMS chips from the SPST till the SP16T configuration. It provides transient Kelvin measurement with a high-sampling rate (every 250ns) in order to characterize the dynamic operation (ON-state, OFF-state and switching events) and the lifetime of the RF MEMS relays from a mechanical and electrical standpoint. The same measurement hardware is also capable of performing RF measurement up to 6 GHz. The PXI-based solution easily handles the high volume of data typically collected in the characterization phase. In addition to characterizing RF-MEMS chips, the new test bench can serve as a platform to develop and validate test routines for volume-test production with ATE.
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