July 28, 2016 12:04 PM ET

Semiconductors and Semiconductor Equipment

Company Overview of Nova Measuring Instruments Ltd.

Company Overview

Nova Measuring Instruments Ltd. designs, develops, produces, and sells process control systems used in the manufacture of semiconductors in Israel. The company offers in-line and x-ray stand-alone metrology systems, as well as integrated optical metrology systems that attach directly to wafer fabrication process equipment. Its products include thin film and optical CD process control for dimensional, films, and material metrology measurements for process control across multiple semiconductor manufacturing process steps, including lithography, etch, chemical mechanical polishing, and deposition. The company’s products also comprise integrated thickness monitoring systems for chemical mechanic...

Building 22

2nd Floor

Weizmann Science Park

Einstein Street

Ness Ziona,  

Israel

Founded in 1993

496 Employees

Phone:

972 73 229 5600

Key Executives for Nova Measuring Instruments Ltd.

Chief Executive Officer and President
Age: 50
Total Annual Compensation: $985.9K
Chief Financial Officer
Age: 47
Total Annual Compensation: $445.7K
Corporate Vice President of Operations
Age: 54
Total Annual Compensation: $312.9K
Corporate Senior Vice President Strategic Software Business Unit
Age: 56
Total Annual Compensation: $309.1K
Chief Technology Officer
Age: 44
Total Annual Compensation: $337.8K
Compensation as of Fiscal Year 2015.

Nova Measuring Instruments Ltd. Key Developments

Nova Measuring Instruments Ltd. and Leti Collaborate to Enhance Process Control Schemes for Advanced Lithography

Leti and Nova Measuring Instruments announced a joint program to develop innovative metrology methods to enable process control solutions for multi e-beam and directed self-assembly (DSA) advanced lithography techniques. Based on this new joint initiative, Nova has already installed its advanced suite of products at Leti's facility in France. In order to meet the fabrication process challenges at the most advanced technology nodes, several lithography technologies are currently evaluated beyond mainstream multi-patterning optical lithography. The main alternatives to be considered include DSA and multi-beam direct-write lithography (ML2). The joint program between Leti and Nova will focus on developing innovative process-control solutions to address the challenges related to these new patterning methods. The collaboration will utilize Nova's T600 multi-channel stand-alone optical metrology platform combined with its innovative MARS modeling software and the recently introduced Hybrid solution, which combines several measurements from different metrology platforms.

Nova Measuring Instruments Ltd. Announces New Hybrid Metrology Concept

Nova Measuring Instruments Ltd. announced a new hybrid metrology concept, which combines measurements from two of its metrology platforms - X-Ray and Optical. With this newly introduced solution, thin film and material parameters (measured on X-Ray metrology platforms) are combined with profile and geometry parameters (measured on Optical CD metrology platforms) for better process control in the most advanced technology nodes. This unique offering utilizes the synergy between the technologies, resulting in superior metrology performance that supports tighter process control schemes for faster time to market. The new hybrid solution relies on Nova's novel optical and X-Ray modeling algorithms and is being evaluated by several key customers.

Nova Measuring Instruments Ltd., Annual General Meeting, Jun 30, 2016

Nova Measuring Instruments Ltd., Annual General Meeting, Jun 30, 2016, at 17:00 Israel Standard Time. Location: Weizmann Science Park Building 22, Einstein St. Ness Ziona Israel Agenda: To consider re-election of each of Messrs. Michael Brunstein, Alon Dumanis, Avi Cohen and Raanan Cohen as a director of the company to hold office until the close of the next annual general meeting; to approve amendments to the employment terms of Mr. Eitan Oppenhaim, the President and Chief Executive Officer of the company; to approve the compensation policy for the company’s directors and officers; to approve and ratify the re-appointment of Kost Forer Gabbay & Kasierer, a member of Ernest & Young, as the independent auditors of the company for the period ending at the close of the next annual general meeting; and to consider audited consolidated financial statements for the year ended December 31, 2015.

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