Company Overview of Teseda Corporation
Teseda Corporation provides hardware and software solutions for silicon debug, failure analysis, and yield enhancement. It offers Diagnostic Manager NetXY, a software tool that enables users to pinpoint the physical location of failing circuit elements in silicon; and V520 and V550 design-for-test enabled engineering test systems for first silicon debug applications. The company also provides Teseda Workbench that imports STIL-based patterns generated by EDA tools that allows the user to assign pins, set levels and timing, run tests, and visualize and analyze the results in vector format or logic waveforms. In addition, it offers Scan Workbench, a scan fail diagnostics solution; DC Field Tri...
6915 SW Macadam Avenue
Portland, OR 97219
Founded in 2001
Key Executives for Teseda Corporation
Chief Executive Officer, President and Director
Director of Marketing and Co-Founder
Director of Software Engineering and Co-Founder
Vice President of Finance
Compensation as of Fiscal Year 2014.
Teseda Corporation Key Developments
ON Semiconductor Purchases Multiple Teseda DI Lab Systems(TM) for Failure Analysis and Defect Isolation
Apr 30 15
Teseda Corporation announced that ON Semiconductor has purchased multiple Teseda DI Lab Systems(TM) for Failure Analysis and Defect Isolation. The integration of scan chain information, failure data and layout information, into a single physical viewing environment, provides highly effective analysis power to the analyst. Teseda's data analysis capability allows to study subtle behavioral patterns and identify even those defects that are, in other circumstances, often overlooked and would remain undetected.
Teseda Corporation Announces the Receipt of an Order for the Teseda Diagnostic Test System from Soft Machines, Inc
Feb 19 15
Teseda Corporation announced the receipt of an order for the Teseda Diagnostic Test System from Soft Machines Inc. Soft Machines, has purchased the Teseda Diagnostic Test System for bench-top stimulus, test pattern debug, validation, and device failure mode stimulation. The Diagnostic Test System is a core design analysis tool used for first silicon bring-up that has provided Soft Machines with a complete bench-top device stimulus and test system to achieve working silicon and prove the invention of VISC ¢ Microprocessor Architecture.
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