Electronic Equipment, Instruments and Components
Company Overview of LitePoint Corporation
LitePoint Corporation designs, develops, and supports wireless testing solutions for developers of wireless devices and consumer electronics, contract manufacturers, and wireless integrated circuit designers. The company offers a range of testing solutions for manufacturing facilities, radio frequency laboratories, and connectivity and cellular chipsets. It offers its products for manufacturers of wireless modules and consumer electronics, including smartphones, tablets, and PCs. The company was founded in 2000 and is based in Sunnyvale, California. As of October 5, 2011, LitePoint Corporation operates as a subsidiary of Teradyne Inc.
965 West Maude Avenue
Sunnyvale, CA 94085
Founded in 2000
Key Executives for LitePoint Corporation
Co-Founder and Chairman Emeritus
Co-Founder and Chief Technology Officer
Senior Vice President of Operations
Compensation as of Fiscal Year 2015.
LitePoint Corporation Key Developments
LitePoint Announces New, Advanced Functionality for its Cellular and Connectivity Products
Mar 2 15
LitePoint announced new, advanced functionality for its cellular and connectivity products, designed to significantly increase manufacturing efficiency and throughput. LitePoint® Factory Efficiency tools are wireless test system options designed specifically to alert a test operator of issues before they impact the line, and save time and labor related to daily maintenance. As demonstrated in customer deployments, these features can enable a test station to deliver a larger volume of devices, resulting in getting more wireless devices to market faster while reducing capital costs and factory floor space. The Factory Efficiency solution will be showcased at Mobile World Congress in Barcelona, Spain March 2 to 5 in the LitePoint Demo Lounge. Factory Efficiency tools enable three key improvements for testing wireless devices in high-volume production environments: Fixture Health Check - Fixture Health Check increases the up-time of each test station by detecting wear-and-tear or other signal integrity problems between the tester and the device under test before these faults result in yield or test quality issues. If a problem with a test setup is detected, the factory operator is immediately notified that test station maintenance is required, and also indicates which tester connection has the fault. potentially saving several hours of lost productivity due to poor test yield and test station troubleshooting. DUT Sense - A common cause of test failure in the factory is a poor connection to the antenna(s) of the device being tested (DUT) when the device is placed in the test fixture improperly. This costs time and can result in false failures. DUT Sense detects these types of failures and alerts the operator immediately that the device being tested is not properly set in the fixture. Automatic Path Loss Calibration - Automatic Path Loss Calibration can reduce the standard test station calibration times from minutes down to seconds, and eliminates the requirement for costly external measurement equipment and specialized operators. This enables an entire factory floor of test stations to be calibrated at the same time, saving time, labor, and calibration equipment cost.
ZTE Corporation Adopts LitePoint Solutions for LTE Smartphone Production Test
Aug 26 14
LitePoint, announced that ZTE Corporation has adopted LitePoint's cellular and connectivity test solutions for calibrating and verifying their latest 4G smartphones in production. The combination of the IQxstream and IQxel-M gives ZTE a flexible and high-performance platform to address wireless technologies. It also allows ZTE to optimize yield, load-balance their production lines and minimize their total cost-of-test allowing continued success in LTE. With the launch of new LTE multiband smartphones in 2014, ZTE forecasts that 4G devices will account for 40% of total terminals shipments in 2014. Benefiting from the availability of new innovative products and cooperation with partners, ZTE expects to continue their strong performance, especially in the smart handset market.
LitePoint Corporation Introduces Low-Cost, PXI-Based Technology for Testing High Bandwidth Smart Devices in the Lab
Jul 15 14
LitePoint Corporation announced the launch of the LitePoint z8653, a new wideband vector signal analyzer (VSA) for development testing of high bandwidth wireless components used in smart phones and tablets. High bandwidth 802.11 ac Wi-Fi is expanding rapidly as smart device users demand the faster performance, high capacity of this new standard. With momentum building for the adoption of Wave 2 features, the performance of existing test equipment is becoming increasingly challenged. The z8653 represents a significant advance in terms of analysis bandwidth and residual measurement floor, making it ideally suited to not only the current technology demands but also future requirements including higher order modulation schemes and carrier aggregation techniques.
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