Electronic Equipment, Instruments and Components
Company Overview of Bruker AXS, Inc.
Bruker AXS, Inc. designs, develops, and manufactures analytical X-ray systems for elemental analysis, materials research, and structural investigations. It offers X-ray and handheld X-ray spectrometry solutions, optical emission spectrometers, wavelength and energy dispersive X-ray spectrometry systems, X-ray diffraction solutions, X-ray metrology analytics, and combustion analysis. The company also provides atomic force and scanning probe microscopes, biological and chemical crystallography solutions, radionuclide analysis equipment, lab and process automation instruments, and X-ray components. Its solutions are used in various applications, including aluminum and metallurgy, art and conser...
5465 East Cheryl Parkway
Madison, WI 53711-5373
Founded in 1997
Key Executives for Bruker AXS, Inc.
President, General Manager, and Managing Director of Bruker AXS Gmbh
President of Bruker Elemental GmbH and Managing Director of Bruker AXS GmbH
President of Bruker Nano Analytics and Managing Director of Bruker Nano Gmbh
Chief Technology Officer and Executive Vice President of X-ray Single Crystal Diffraction (scd) Business and Head of Microanalysis Business
Managing Director of Bruker UK
Compensation as of Fiscal Year 2015.
Bruker AXS, Inc. Key Developments
Bruker AXS, Inc. Unveils New HPC Pixel Detector for D8 Discover Diffraction Solutions
Sep 9 15
BRUKER AXS has unveiled the PILATUS3 R 100K-A 2D X-ray detector, a new hybrid photon counting, or HPC, pixel detector for its D8 DISCOVER diffraction solutions. The PILATUS3 R is a new Hybrid Photon Counting (HPC) pixel detector developed by the Swiss company DECTRIS, the technology leader for HPC detectors. In close collaboration, BRUKER AXS and DECTRIS have seamlessly integrated this powerful new detector into the D8 DISCOVER to enable full usability for various X-ray diffraction applications. The PILATUS3 R 100K-A significantly extends the capabilities of the D8 DISCOVER for various types of diffraction experiments. The HPC pixel detector offers a unique combination of superb performance features: no dark current and read out noise, an excellent point spread function, and higher available frame rates, count rates and dynamical range. These unmatched capabilities allow the HPC detector to produce excellent diffraction data in a broad range of applications, especially in those experiments where 2theta and gamma coverage is essential, including micro diffraction, texture, residual stress, grain size, GISAXS, micro-HRXRD and kinetic studies. The addition of the HPC pixel detector completes Bruker AXS' cutting edge X-Ray detector portfolio which features the 1D LYNXEYE silicon strip detectors with unrivalled energy resolution, the high speed, shutterless PHOTON 100 CMOS APS detector for single crystal diffraction, and the large active area, noise-free VANTEC MikroGap detector.
Bruker AXS Introduces New X-Ray Diffraction Solution
Mar 13 15
Bruker AXS has introduced a new D8 ENDEAVOR process diffraction solution for the analysis of polycrystalline material by means of X-ray powder diffraction. The new D8 ENDEAVOR is the successor to D4 ENDEAVOR process diffractometer. The D8 ENDEAVOR is equipped with the latest 1-dimensional LYNXEYE XE detector technology enabling shortest measurement times while maintaining best sensitivity for the detection of crystallographic phases with lowest concentrations. This exceptional feature of the D8 ENDEAVOR is the essential for powerful process and quality control in the aluminum, cement, geology, mining, pharmaceutical, and pigment industries. The flexibility of the sample handling with the new D8 ENDEAVOR has been extended to guarantee higher adaptability and reliability: Conveyor belt or external robot interface for automated sample loading, continued measurements during manual loading of single samples or sample trays while measurements are executed, fast and robust internal sample handling, as well as a permanently kept horizontal sample position - all this is realized with the new design of the D8 ENDEAVOR. The new D8 ENDEAVOR is easy to operate in either standalone PC-based or in automation-integrated mode. On top, the optional and unique touchscreen interface simplifies measurement and data analysis for non-expert operation. Another crucial part of the diffraction solutions based on the new D8 ENDEAVOR is the software DIFFRAC.SUITE and TOPAS. The well-proven DIFFRAC.SUITE offers intuitive operation based on a graphical user interface that can be customized to match the operator's requirements. The brand-new DIFFRAC.DQUANT plug-in provides enhanced conventional or legally mandatory quantification methods based on calibrations, while the unique TOPAS puts the D8 ENDEAVOR ahead of any other X-ray diffraction instrumentation. With TOPAS, the quantitative crystalline phase and micro-structure analysis can be executed accurately without any standard samples due to the unique implementation of the fundamental parameter approach.
Vertical Analytics LLC Enters Into Agreement With Bruker AXS, Inc
Dec 6 13
Acacia Research Corporation announced that its Vertical Analytics LLC subsidiary has entered into an agreement with Bruker AXS, Inc. The agreement resolves litigation that was pending in the United States District Court for the District of Delaware.
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