aehr test systems (AEHR:NASDAQ CM)
President of Aehr Test Systems Japan K.K., Aehr Test Systems
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As of Fiscal Year 2013
Mr. Kunio Sano has been President of Aehr Test Systems Japan K.K. at Aehr Test Systems since January 2001. Mr. Sano joined Aehr Test Systems as Vice President, Aehr Test Systems Japan K.K., Aehr Test Systems's subsidiary in Japan, in June 1998. From 1991 to 1998, Mr. Sano served as Manager of Development Engineering Department at Tokyo Electron Yamanashi Limited, a leading worldwide semiconductor equipment manufacturer. Mr. Sano received a B.S.E.E. from Sagami Institute ...
400 Kato TerracePhone: 510-623-9400
Fremont, California 94539
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Shonan Institute of Technology
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Japan Electronic Materials Corporation
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