Aehr Test Systems Receives $1.7 Million Follow-On Order for its Advanced Burn-In and Test Systems
Jun 25 15
Aehr Test Systems said it has received a $1.7 million follow-on order for its Advanced Burn-in and Test Systems (ABTS) from a leading multi-national manufacturer of advanced logic integrated circuits (ICs) for automotive, embedded processing, digital signal processing and analog applications. The order includes prepayments in order to lock in short lead times and special pricing, and the systems are expected to ship within the next six months.
Aehr Test Systems Receives Order for ABTS Burn-In and Test System in China
May 12 15
Aehr Test Systems has received an order from a new customer in China for shipment of an ABTS burn-in and test system for high temperature operating life, or HTOL, testing of devices for reliability characterization. The system is expected to ship within the next month. Aehr Test has now been selected by eight customers in China to perform their HTOL and burn-in processes with advanced ABTS burn-in and test platform. High-temperature operating life is a reliability test applied to integrated circuits to determine their intrinsic reliability in which the devices are subjected to temperatures as high as 150C for extended periods of time. In typical HTOL reliability tests, failure mechanisms are accelerated by burning-in the devices for 1,000 hours to confirm that the basic design and fabrication process of a device will meet the reliability targets over an extended period of normal use. The ABTS family of products is based on a new hardware and software platform that is designed to address not only devices, but also future devices for many years to come. It can test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. ABTS systems can be configured with up to 72 burn-in boards, up to 320 I/O channels, 32M of test vector memory per channel and up to 16 independent device power supplies. The ABTS system is optimized for use with the Sensata iSocket Thermal Management Technology, which provides a scalable cost-effective solution using individual device temperature control for up to 64 devices per burn-in board and up to 75 watts per device or more. Individual temperature control enables high-power devices with a broad range of power dissipation to be burned-in simultaneously in a single burn-in chamber while maintaining a precise device temperature. The ABTS system also uses N+1 redundancy technology for many key components in the system to maximize system uptime.
Aehr Test Systems Announces Follow-On Order for FOX-15(TM) WaferPak(TM) Contactors
May 7 15
Aehr Test Systems announced it has received over $700,000 in follow-on orders for WaferPak full-wafer contactors for its FOX-15™ multi-wafer burn-in and test system from supplier of automotive and industrial integrated circuits. The WaferPak contactors are expected to ship within the next four to six months.
Aehr Test Systems Receives $6 Million Order for a FOX-15(TM) Multi-Wafer Burn-In System for Production Test & Burn-In Application
Apr 27 15
Aehr Test Systems has received an order from a new customer for a FOX-15 Multi-Wafer Test and Burn-In System, multiple WaferPak™ contactors and a WaferPak Aligner. The order is for more than $6 million and is for a production test and burn-in application. The order includes prepayments in order to lock in lead times and volume-related discounts and is expected to ship within the next six months.
Aehr Test Systems Announces Unaudited Consolidated Earnings Results for the Third Quarter and Nine Months Ended February 28, 2015
Mar 26 15
Aehr Test Systems announced unaudited consolidated earnings results for the third quarter and nine months ended February 28, 2015. Net sales were $2,027,000, compared with $5,612,000 for the same period of fiscal 2014. Aehr Test reported a non-GAAP net loss of $1.5 million, or $0.12 per diluted share, and a GAAP net loss of $1.7 million, or $0.14 per diluted share, in the third quarter of fiscal 2015. This compares to the non-GAAP net income of $447,000 or $0.04 per diluted share, and GAAP net income of $212,000, or $0.02 per diluted share in the third quarter of fiscal 2014. Loss from operations was $1,763,000 against income of $262,000, a year ago. Loss before income tax (expense) benefit was $1,660,000 against income of $234,000 a year ago. Net loss attributable to Aehr Test Systems common shareholders was $1,726,000 or $0.14 basic and diluted per share against net income of $212,000 or $0.02 basic and diluted per share a year ago.
For the nine-month period, the company reported net sales were $8,200,000 against $14,314,000, a year ago. Loss from operations was $4,883,000 against income of $284,000, a year ago. Loss before income tax (expense) benefit was $4,711,000 against income of $178,000 a year ago. Net loss attributable to Aehr Test Systems common shareholders was $4,747,000 or $0.40 basic and diluted per share against net income of $183,000 or $0.02 basic and diluted per share a year ago. Non-GAAP net loss was $4,053,000 or $0.34 diluted per share against net income of $808,000 or $0.07 diluted per share a year ago.