Advantest Introduces New Device Power Supply to Increase Versatility and Cost
Efficiency of Its T2000 Test Platform
New DPS150AE Module Provides High-Throughput, Multi-Site Testing
Capability for High- and Low-Current Semiconductors
TOKYO, JAPAN -- (Marketwired) -- 06/26/14 -- Leading semiconductor
test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE)
has announced its new T2000 Enhanced Device Power Supply 150A
(DPS150AE) module that enables its T2000 test platform to handle the
load requirements for highly accurate testing of both high-current
and low-voltage semiconductors, including microprocessor units
(MPUs), application-specific ICs (ASICs) and field-programmable gate
arrays (FPGAs). The module improves the capabilities of the T2000
platform in performing high-throughput, multi-site testing of
targeted devices with the lowest cost of test.
Available as a field upgrade or as a factory-installed option on the
T2000 EPP (Enhanced Performance Package) system, the DPS150AE module
greatly increases testing versatility. With the module's high-speed
bus capability and Advantest's Smart Test Condition Memory (TCM), the
T2000 EPP system enables module splitting in which one module can
test multiple devices concurrently. Each device under test (DUT) can
be monitored and assessed independently.
The new module also allows test conditions to be set and, if
necessary, adjusted much more quickly with TCM. This function
pre-loads all of a test program's parameters and includes an editing
function so that test engineers can graphically modify any of the
settings on the fly.
The DPS150AE has eight channels of high current (HC) functions that
support a large current output as high as 16 amps and eight channels
of low current (LC) functions that support a current output of up to
2.66 amps. It also has a function that operates multiple channels
connected in parallel beyond the module. This allows the module to
accommodate up to 80 channels of HC functions, each providing 16
amps, to generate up to 1,280 amps for high-current devices.
"Our new DPS module's high parallelism and ability to perform highly
cost-effective testing over multiple power domains allow customers to
quickly and efficiently test a wide range of IC types," said Dr.
Toshiyuki Okayasu, executive officer and executive vice president,
SoC Test Business Group at Advantest Corporation. "The system's
flexibility enables low-cost testing and helps our customers to bring
their newest device designs to market much faster."
The DPS150AE is scheduled to begin shipping to customers in August.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer
of automatic test equipment (ATE) for the semiconductor industry and
a premier manufacturer of measuring instruments used in the design
and production of electronic instruments and systems. Its
leading-edge systems and products are integrated into the most
advanced semiconductor production lines in the world. The company
also focuses on R&D for emerging markets that benefit from
advancements in nanotech and terahertz technologies, and has
introduced multi-vision metrology scanning electron microscopes
essential to photomask manufacturing, as well as a groundbreaking 3D
imaging and analysis tool. Founded in Tokyo in 1954, Advantest
established its first subsidiary in 1982, in the USA, and now has
subsidiaries worldwide. More information is available at
VP of Global Marketing Communications
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