Cascade Microtech COMPASS 2014 Users' Conference Announces Final Call for Papers

Cascade Microtech COMPASS 2014 Users' Conference Announces Final Call for Papers 
BEAVERTON, OR -- (Marketwired) -- 04/11/14 --  Cascade Microtech,
Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of
integrated circuits at the wafer level, announces the final Call for
Papers for its second users' conference, COMPASS 2014. The conference
will provide Cascade Microtech users with best practices, tools and
techniques to increase productivity across wafer probing
applications. The conference will address important issues in various
use cases to include device characterization and modeling,
reliability, and manufacturing test. The full-day conference begins
with a welcome reception on October 9, 2014 leading into a full day
of workshops and presentations on October 10th at the Hilton Rome
Airport in Rome, Italy 
"COMPASS is a part of Cascade Microtech's new 'CONNECT' initiative,
which we are developing in conjunction with our customers and
partners who share a desire to stay ahead of technology," said
Debbora Ahlgren, Vice President of Marketing. "We believe the
accumulated knowledge of our industry peers drives discovery and
innovation, and that we can facilitate that exchange with our
COMPASS will give users the opportunity to share ideas and solutions
with fellow attendees who utilize a wide spectrum of process
technologies. Topics will focus on industry-wide challenges and
emerging technology requirements. Attendees will learn about the
newest probe solutions for device characterization and modeling, as
well as solutions for enabling high-volume test, while networking
with technical experts from Cascade Microtech as well as the
company's customers and partners. 
Abstracts are being accepted through the end of April for 25-minute
presentations for technology tracks covering a wide variety of both
engineering and production topics including, but not limited to:  

--  RF/mmW measurement and calibration methodology
--  High-voltage/high-current on-wafer device characterization
--  Sub-THz measurements up to 500 GHz and beyond
--  3D TSV RF characterization
--  Probe card metrology tools
--  40+ GHz test including automotive radar, cell phone short
    haul/backhaul, 802.11ad

To see the full list of suggested topic areas, and view the formal Call
for Papers, visit To respond to the
Call for Papers, send an email with your name, presentation title,
and a 200-word abstract to  
About Cascade Microtech, Inc. 
 Cascade Microtech, Inc. (NASDAQ:
CSCD) is a worldwide leader in precision contact, electrical
measurement and test of integrated circuits (ICs), optical devices
and other small structures. For technology businesses and scientific
institutions that need to evaluate small structures, Cascade
Microtech delivers access to electrical data from wafers, ICs, IC
packages, circuit boards and modules, MEMS, 3D TSV, LED devices and
more. Cascade Microtech's leading-edge stations, probes, probe cards
and integrated systems deliver precision accuracy and superior
performance both in the lab and during production manufacturing of
high-speed and high-density semiconductor chips. For more information
Debbora Ahlgren
Cascade Microtech, Inc.
(503) 601-1934 
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