Aehr Test Systems Announces Upcoming Investor Event FREMONT, Calif., Nov. 18, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that the Company's President and CEO, Gayn Erickson, is scheduled to participate in the following investor event: 2nd Annual Midtown CAP Summit Marriott Marquis, New York, NY December 11, 2013 About the Midtown CAP Summit The Midtown CAP Summit is hosted by executive management from the following participating companies: Aehr Test Systems (AEHR), Axcelis, Brooks Automation, Camtek, Cascade Micro, Cohu, Electro Scientific, Entegris, FormFactor, inTEST, Intevac, LTX-Credence, Mattson Technology, Nanometrics, Nova Measuring, Rudolph Technologies, Tessera, Ultra Clean Technology, Ultratech and Veeco Instruments, and will feature a "round-robin" format consisting of a series of small group meetings. The Midtown CAP Summit is by invitation only and is open to accredited investors and publishing research analysts. As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is November 30. To RSVP for the Midtown CAP Summit, please contact the event's co-chairs: Laura J. Guerrant-Oiye Claire E. McAdams Guerrant Associates Headgate Partners LLC Phone:(808) 882-1467 Phone: (530) 265-9899 Email:firstname.lastname@example.org Email: email@example.com About Aehr Test Systems Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic and memory integrated circuits and has an installed base of more than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, capacity needs and opportunities for Aehr Test products in package and wafer level test. Aehr Test has developed and introduced several innovative products, including the ABTS^TM and FOX^TM families of test and burn-in systems and the DiePak® carrier. The ABTS system is used in production and qualification testing of packaged parts for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com. CONTACT: Gary Larson Chief Financial Officer (510) 623-9400 x321
Aehr Test Systems Announces Upcoming Investor Event
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