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Aehr Test Systems Announces $2 Million in Follow-On Orders From Leading IC Manufacturer as Automotive Test and Burn-In Market



Aehr Test Systems Announces $2 Million in Follow-On Orders From Leading IC
Manufacturer as Automotive Test and Burn-In Market Continues to Expand

FREMONT, Calif., Sept. 9, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, today announced at the International Test Conference (ITC) that it
has received $2 million in production orders for its burn-in and test systems
from a leading manufacturer of advanced logic integrated circuits (ICs) for
automotive, embedded processing, digital signal processing and analog
applications. The orders include down payments to lock in delivery slots and
volume pricing discounts. Shipments of these systems are scheduled to be
completed by the third quarter of Aehr Test's fiscal 2014.

The orders are for multiple Advanced Burn-in and Test Systems (ABTS^TM) and
Engineering Workstations. Two configurations of the ABTS system were
ordered. The first configuration features a low-cost high-volume configuration
targeted at production test and burn-in of lower-power devices, and offers
compatibility with the customer's extensive inventory of burn-inboards for our
previous MAX™ family of test and burn-in systems. The second configuration
features individual device temperature control for improved thermal control of
higher-power devices, which is needed for sophisticated processors fabricated
with state-of-the-art processes.

"We are pleased to receive these orders for additional production test and
burn-in systems, as it is an indication of our customer's success in the
growing market for automotive and embedded applications," said Carl Buck, vice
president of marketing at Aehr Test Systems. "The Engineering Workstations
 will give the customer's engineers the ability to develop programs
efficiently and cost-effectively in their engineering labs at several
development locations."

Aehr is showcasing its latest solutions for highly parallel testing of devices
that incorporate Design-for-Test (DFT) or Built-In Self-Test (BIST)
capabilities at ITC in Anaheim, CA. The exhibits are open Tuesday through
Thursday, September 10-12.

The Aehr Test solutions all have the capability to test a large number of
devices in parallel in a single system. Combined with devices which utilize
BIST or DFT, they show their greatest benefit when test times are long, which
is common in today's memories and processors. The ABTS system performs highly
parallel testing of packaged parts. The FOX^TM-1 system performs sort testing
of all the devices on a wafer in a single touchdown. The FOX-15 system
combines these concepts and can perform wafer sort testing, flash cycling, or
wafer-level burn-in on 15 wafers in a single load, dramatically decreasing the
number of testers that would normally be required for these functions.

The ABTS family of packaged-part test and burn-in systems features a new
tester-per-pin hardware and software architecture. It can test and burn-in
both logic and memory devices, including resources for high pin-count devices
and configurations for higher-power and lower-power applications. The ABTS
system can be configured with up to 72 burn-in boards with up to 320 I/O
channels each and 32M of test vector memory per channel. The ABTS system is
optimized for use with the Sensata iSocket* Thermal Management Technology,
which provides a scalable cost-effective solution using individual device
temperature control for ICs up to 75 watts or more.

The FOX-1 full wafer parallel test system has the capability to test thousands
of die in a single touchdown, thus providing a cost-effective solution for
devices with long test times such as flash and microcontrollers with embedded
flash. Differentiating itself from typical testers, the FOX-1 contains a high
ratio of power supplies to I/O channels, enabling the testing of thousands of
die per wafer in a single touchdown.

The FOX-15 Test and Burn-in System contains probe cards and test electronics
for up to 15 wafers in parallel for test applications such as automotive ICs,
flash memory, DRAMs, sensors and VCSELs (laser diodes). The FOX-15 system can
also perform burn-in at the wafer level so that Known Good Die (KGD) can be
produced for stacked die and through silicon via (TSV) applications.

*iSocket is a trademark of Sensata Technologies, Inc.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test.  Aehr Test has developed and introduced several innovative
products, including the ABTS and FOX families of test and burn-in systems and
the DiePak® carrier. The ABTS system is used in production and qualification
testing of packaged parts for both lower-power and higher-power logic as well
as all common types of memory devices. The FOX system is a full wafer contact
test and burn-in system used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit Aehr Test's website at www.aehr.com.

Safe Harbor Statement

This press release contains certain forward-looking statements based on
current expectations, forecasts and assumptions that involve risks and
uncertainties. These statements are based on information available to Aehr
Test as of the date hereof and actual results could differ materially from
those stated or implied due to risks and uncertainties. Forward-looking
statements include statements regarding expected shipping dates of our ABTS
systems. The risks and uncertainties that could cause our results to differ
materially from those expressed or implied by such forward-looking statements
include, without limitation, general world economic conditions and events, the
state of the semiconductor equipment market, our ability to maintain
sufficient cash to support operations, acceptance by customers of the ABTS
technology, acceptance by customers of the ABTS systems shipped upon receipt
of a purchase order and the ability of new products to meet customer needs or
perform as described.  See Aehr Test's recent 10-K and other reports from time
to time filed with the Securities and Exchange Commission for a more detailed
description of the risks facing our business. Aehr Test disclaims any
obligation to update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this press
release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
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