Aehr Test Systems Appoints Mark Allison as Vice President of Worldwide Sales

Aehr Test Systems Appoints Mark Allison as Vice President of Worldwide Sales

FREMONT, Calif., Aug. 12, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, today announced that Mark Allison has been appointed Vice President
of Worldwide Sales. Mr. Allison will direct Aehr Test's worldwide sales

Mr. Allison has over 25 years of experience in the semiconductor manufacturing
and Automatic Test Equipment (ATE) industries. His last position was as
Executive Vice President of Marketing at Verigy, a leader in the ATE business
that was acquired by Advantest in 2011 for $1.1 billion. Prior to Verigy, Mr.
Allison held various sales, marketing, general management and test engineering
positions at companies including Advantest, Integrated Measurement Systems,
Megatest, Micron and Texas Instruments. Mr. Allison received his BSEE from the
University of Notre Dame.

"We are pleased to have Mark join us. He brings Aehr Test strong experience in
marketing and selling highly sophisticated test systems to semiconductor
manufacturers," said Gayn Erickson, president and chief executive officer of
Aehr Test Systems. "We are confident that his knowledge of the product
applications and the customer base will help us to further expand the sales of
our test and burn-in systems. As our customers are increasingly looking to
Aehr Test for more cost-effective solutions to meet their test needs, we
believe that this is an excellent time to bring on a person with Mark's

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS^TM and FOX^TM families of test and burn-in
systems and the DiePakĀ® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and acceptance
of Aehr Test's products. Actual results may vary from projected results. These
risks and uncertainties include, without limitation, acceptance by customers
of Aehr Test's technology, acceptance by customers of the systems shipped upon
receipt of a purchase order and the ability of new products to meet customer
needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other
reports from time to time filed with the Securities and Exchange Commission
(SEC) for a more detailed description of the risks facing our business. The
Company disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances occurring after
the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
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