Aehr Test Systems Announces $2.5 Million in Orders From Leading IC Manufacturer

Aehr Test Systems Announces $2.5 Million in Orders From Leading IC

FREMONT, Calif., July 26, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, today announced it has received over $2.5 million in production
orders for its burn-in and test systems from a leading manufacturer of
advanced logic integrated circuits (ICs) for automotive, embedded processing,
digital signal processing and analog applications. The orders include down
payments to lock in delivery slots and volume pricing discounts.

The orders are for multiple Advanced Burn-in and Test Systems (ABTS™) and a
follow-on MAX^TM system. The ABTS systems feature a new low-cost high-volume
configuration targeted at production test and burn-in of lower-power devices.
This new ABTS offers the option of high voltage Device Power Supplies
configurable with 60V, 80V, 150V or 230V programmable voltage ranges, which
are needed for automotive and power-line applications. Shipments of this new
ABTS configuration are expected to begin in the fourth quarter of calendar
year 2013.

"We are pleased to receive these orders for production test and burn-in
systems," said Carl Buck, vice president of marketing at Aehr Test Systems.
"The new ABTS system configuration offers over 50% more device test capacity
than our previous MAX family of production test and burn-in systems.
Importantly, this new ABTS is designed to allow the customer to continue to
use their extensive inventory of MAX-style burn-in boards on the ABTS while
also offering the increased capacity for new devices. This ABTS configuration
extends the capabilities of our MAX systems by providing an increase to 128
I/O channels and 8 unique device power supplies per burn-in board, in addition
to the new high-voltage supplies.

"The new configuration extends our already successful ABTS-Pi system, which
features Individual Temperature Control of each device for high power
applications, to provide a lower cost and higher parallel solution for
automotive, standard logic and high voltage applications," Buck concluded.

The ABTS family of products is based on a new hardware and software platform
that is designed to address not only today's devices, but also future devices
for many years to come. It can test and burn-in both logic and memory devices,
including resources for high pin-count devices and configurations for
high-power and low-power applications. The ABTS system can be configured with
up to 72 burn-in boards with up to 320 I/O channels each and 32M of test
vector memory per channel. The ABTS system is optimized for use with the
Sensata iSocket* Thermal Management Technology, which provides a scalable
cost-effective solution using individual device temperature control for ICs up
to 75 watts or more. Individual temperature control enables high-power devices
with a broad range of power dissipation to be burned-in simultaneously in a
single burn-in chamber while maintaining a precise device temperature. The
ABTS system also uses N+1 redundancy technology for many key components in the
system to maximize system uptime.

*iSocket is a trademark of Sensata Technologies, Inc.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS and FOX^TM families of test and burn-in systems
and the DiePak® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at

Safe Harbor Statement

This press release contains certain forward-looking statements based on
current expectations, forecasts and assumptions that involve risks and
uncertainties. These statements are based on information available to Aehr
Test as of the date hereof and actual results could differ materially

from those stated or implied due to risks and uncertainties. Forward-looking
statements include statements regarding expected initial shipping dates of our
ABTS systems. The risks and uncertainties that could cause our results to
differ materially from those expressed or implied by such forward-looking
statements include, without limitation, general world economic conditions and
events, the state of the semiconductor equipment market, our ability to
maintain sufficient cash to support operations, acceptance by customers of the
ABTS technology, acceptance by customers of the ABTS systems shipped upon
receipt of a purchase order and the ability of new products to meet customer
needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other
reports from time to time filed with the Securities and Exchange Commission
for a more detailed description of the risks facing our business. The Company
disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances occurring after
the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
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