Advantest Enters Protocol-Based Flash Storage Market With New Versatile Test Platform

Advantest Enters Protocol-Based Flash Storage Market With New Versatile Test 
Platform 
Company's Years of Engineering Development Work Yield Flexible Test
Solution for All Next-Generation SSDs 
TOKYO -- (Marketwired) -- 07/25/13 --  Leading semiconductor test
equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has
entered the market for testing advanced PCI Express (PCIe) 3.0 NVMe
solid-state drives (SSDs) for enterprise and consumer applications
with the versatile NEO-SSD platform, on which the company is building
a family of test solutions that are scheduled to begin shipping to
customers in the fourth quarter of this calendar year. The
configurable NEO-SSD platform, capable of supporting multiple
protocols, addresses SSD system-level test requirements by providing
a wide range of test capabilities, including engineering validation,
design verification, reliability demonstration and production
testing. 
SSD production volumes are projected to grow by a factor of 5X to
over 200 million units by 2017, according to industry research firm
Gartner. With the market in its early stages of widespread adoption
and both device protocols and test strategies still being refined,
effective test solutions must deliver high performance and
flexibility. 
The NEO-SSD platform uses Advantest's Tester-per-DUT architecture,
enabling customers to balance cost and performance to meet their
specific needs. The system is designed to handle a variety of form
factors, such as drives and cards, as well as multiple protocols,
including the PCIe 3.0 interface. As the emerging bus standard for
data centers, desktop computers, ultrabooks and mobile electronics,
PCIe is creating a disruption in the test market by requiring several
versions of new protocol support (such as PCIe NVMe, AHCI, UFS and
SAS), higher bus speeds at full performance and more control over
device power supplies. This creates demand for efficient
multi-protocol test solutions with the scalability and cost
effectiveness to enable high-volume production of high-quality SSDs. 
"NEO-SSD allows us to develop the first truly scalable,
platform-based solutions for SSDs, incorporating high-performance
testing, fast operating speed and high signal integrity at a very low
cost of test," said Colin Ritchie, vice president of GTRI, Advantest
America. "Using our Tester-per-DUT architecture, NEO-SSD testers
won't have to share resources. This enables breakthrough enterprise
performance and quality without sacrificing cycle time or test
coverage." 
About Advantest Corporation
 A world-class technology company,
Advantest is the leading producer of automatic test equipment (ATE)
for the semiconductor industry and a premier manufacturer of
measuring instruments used in the design and production of electronic
instruments and systems. Its leading-edge systems and products are
integrated into the most advanced semiconductor production lines in
the world. The company also focuses on R&D for emerging markets that
benefit from advancements in nanotech and terahertz technologies, and
has introduced multi-vision metrology scanning electron microscopes
essential to photomask manufacturing, as well as a groundbreaking 3D
imaging and analysis tool. Founded in Tokyo in 1954, Advantest
established its first subsidiary in 1982, in the USA, and now has
subsidiaries worldwide. More information is available at
www.advantest.com. 
COMPANY CONTACT:
Judy Davies
VP of Global Marketing Communications
+1 408-456-3717
judy.davies@advantest.com