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Advantest Now Delivering New T5831 System for Testing NAND Flash and NAND-Based MCPs Used in Mobile Electronics

Advantest Now Delivering New T5831 System for Testing NAND Flash and NAND-Based 
MCPs Used in Mobile Electronics 
New Tester Combines High Productivity With Low Cost of Test in
Modular, Extendible System Design 
TOKYO -- (Marketwired) -- 07/08/13 --  Leading semiconductor test
equipment supplier Advantest Corporation's (TSE: 6857) (NYSE: ATE)
new T5831 system for testing next-generation ICs used in mobile
applications, including NAND Flash with high-speed ONFi or Toggle
Mode interfaces as well as managed NAND devices such as embedded
multi-media cards (eMMC), is now being delivered to customers. The
versatile tester also supports concurrent testing of both NAND Flash
and mobile DRAM in a multi-chip package (MCP). 
The T5831's design enables highly parallel testing while delivering
the required functionality at a low cost of test. It provides the
most economical solution for today's testing needs with the
upgradability to extend customers' return on investment for future
requirements. The accompanying engineering solution, T5831 ES, is
ideal for test program development and device characterization,
improving customers' overall time to market. 
The system has several key features that enable the fastest test time
for NAND Flash. The system's Tester-Per-Site(TM) architecture enables
high throughput and the industry's highest device power supply
current per DUT speeds up programming and erasing operations. In
addition, tester hardware can perform on-the-fly analysis of
error-correcting codes (ECC), eliminating all test time overhead
associated with post-processing. 
Real-time source-synchronous functionality maximizes yields while
improving throughput over traditional post-processing methods. The
system automatically makes cycle-by-cycle adjustments to account for
timing drifts due to differences in process-voltage-temperature (PVT)
and jitter, ensuring data-eye accuracy for optimal yield at high
speeds. Other necessary functions such as bad block management,
redundancy analysis and custom/random data generation also are
supported, making the T5831 the ideal tester for all NAND Flash
testing needs. 
"This new test solution delivers the performance that our customers
need today in a modular design with the extendibility to meet
tomorrow's changing test requirements," said Masuhiro Yamada,
executive vice president of memory test for Advantest Corporation.
"The T5831 extends Advantest's leadership in the ATE market and will
add to our worldwide installed base of more than 8,000 memory test
systems." 
About Advantest Corporation
 A world-class technology company,
Advantest is the leading producer of automatic test equipment (ATE)
for the semiconductor industry and a premier manufacturer of
measuring instruments used in the design and production of electronic
instruments and systems. Its leading-edge systems and products are
integrated into the most advanced semiconductor production lines in
the world. The company also focuses on R&D for emerging markets that
benefit from advancements in nanotech and terahertz technologies, and
has introduced multi-vision metrology scanning electron microscopes
essential to photomask manufacturing, as well as a groundbreaking 3D
imaging and analysis tool. Founded in Tokyo in 1954, Advantest
established its first subsidiary in 1982, in the USA, and now has
subsidiaries worldwide. More information is available at
www.advantest.com. 
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COMPANY CONTACT:
Judy Davies
VP of Global Marketing Communications
+1 408-456-3717
judy.davies@advantest.com 
 
 
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