Advantest Introduces New Test Floor Intelligence Software Solution to Improve Efficiencies in Semiconductor Test Operations

Advantest Introduces New Test Floor Intelligence Software Solution to Improve 
Efficiencies in Semiconductor Test Operations Through "Big
Data" Management 
Second-Generation Solution Provides Comprehensive View of Test
Operations to Reduce Costs 
TOKYO -- (Marketwired) -- 06/27/13 --  Leading semiconductor test
equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has
introduced its newest Test Floor Intelligence software solution, TFI
2.0, designed to improve the overall equipment effectiveness (OEE) of
production test operations by efficiently mining and analyzing the
large volume of data generated during semiconductor testing. 
"Optimizing OEE is not a simple task. It requires a combination of
rich data sources, fast analytics and automated process control to
optimize tester utilization, test time, maintenance cycles and
effective yield," said Stephen Ledford, director of global production
solutions at Advantest. "Our TFI 2.0 is the first step in delivering
integrated data collection and reporting for all Advantest testers
accessible from a single server, enabling flexible factory
integration based on an open solution architecture." 
Advantest's second-generation TFI solution performs real-time data
collection, control and web-based reporting, enabling test-floor
managers to instantly assess tester utilization, equipment status,
fault detection, effective yield and other key operating parameters.
The system also identifies potential problems relating to the test
program, interface hardware and test equipment before they impact
productivity. 
The software suite manages the rich data infrastructure available
from today's automatic test equipment (ATE), which goes well beyond
traditional test data logs to include real-time equipment status and
health, maintenance records and test cell configuration. It delivers
unprecedented interactivity, customizability and scalability while
handling terabytes of test data. 
"OEE has become a major priority for semiconductor companies and
OSATs (outsourced semiconductor assembly and test) as they work to
optimize every aspect of the test process," said Ron Leckie, industry
analyst and consultant at Infrastructure Advisors. "While multi-site
testing has had a big, positive impact on equipment efficiency, the
next major gains will likely come from a new generation of software
tools that actively monitor and control the overall test process
including ATE, handlers and probers, interface hardware, test
programs and test operations." 
Designed for use by major fabless IC companies, OSATs and
semiconductor foundries, TFI 2.0 will be available worldwide in July
2013. 
About Advantest Corporation
 A world-class technology company,
Advantest is the leading producer of automatic test equipment (ATE)
for the semiconductor industry and a premier manufacturer of
measuring instruments used in the design and production of electronic
instruments and systems. Its leading-edge systems and products are
integrated into the most advanced semiconductor production lines in
the world. The company also focuses on R&D for emerging markets that
benefit from advancements in nanotech and terahertz technologies, and
has introduced multi-vision metrology scanning electron microscopes
essential to photomask manufacturing, as well as a groundbreaking 3D
imaging and analysis tool. Founded in Tokyo in 1954, Advantest
established its first subsidiary in 1982, in the USA, and now has
subsidiaries worldwide. More information is available at
www.advantest.com. 
COMPANY CONTACT:
Judy Davies
VP of Global Marketing Communications
+1 408-456-3717
judy.davies@advantest.com 
 
 
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