Aehr Test Systems to Participate in the Fifth Annual CEO Investor Summit 2013

Aehr Test Systems to Participate in the Fifth Annual CEO Investor Summit 2013

Accredited Investor and Publishing Research Analyst Event to be Held
Concurrently With SEMICON West and Intersolar 2013 in San Francisco

FREMONT, Calif., June 17, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR),  a worldwide supplier of semiconductor test and burn-in
equipment, today announced that Gayn Erickson, President and CEO, will present
at the Fifth Annual CEO Investor Summit 2013, Wednesday, July 10, 2013 in San
Francisco, California.

About The Fifth Annual CEO Summit

The CEO Summit is an accredited investor and publishing research analyst event
that is held concurrently with SEMICON West and Intersolar 2013 in San
Francisco. The event is hosted by executive management from participating
companies and will feature a "round-robin" format consisting of small group
meetings, each 25 minutes in duration.

The CEO Investor Summit is by invitation only and is open to accredited
investors and publishing research analysts.As space is limited, please RSVP
early. Hosts reserve the right to limit attendance as necessary. The last
day for registration is June 21, 2013.

While held concurrently with SEMICON West and Intersolar 2013, the event is
not affiliated with the show.

RSVP Contacts for Fifth Annual CEO Summit 2013

To RSVP for the CEO Summit, please contact either of the Summit's co-chairs.

Laura J. Guerrant-Oiye         Claire E. McAdams
Guerrant Associates            Headgate Partners LLC
Phone:(808) 882-1467          Phone: (530) 265-9899
Email:lguerrant@guerrantir.com Email: claire@headgatepartners.com

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test.Aehr Test has developed and introduced several innovative
products, including the ABTS^TM and FOX^TM families of test and burn-in
systems and the DiePakĀ® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.
 
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