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Advantest Develops Terahertz Wave Spectroscopy and Imaging Analysis Platform

  Advantest Develops Terahertz Wave Spectroscopy and Imaging Analysis Platform

Optical Fiber-Linked THz Source / Detector Modules Support Terahertz Research

Business Wire

TOKYO -- June 5, 2013

Leading semiconductor test equipment supplier Advantest Corporation (TSE:
6857, NYSE: ATE) announced today that it has developed a terahertz wave
spectroscopy and analysis platform, a new entry in the company’s line-up of
non-invasive analysis equipment utilizing terahertz waves. By breaking out the
terahertz source and detector into modules connected to the mainframe by
optical fiber cables, the new product enables free layout of the area to be
measured, greatly expanding the applications of the technology. As an
instrument for terahertz research and development of new applications, it
brings new possibilities for terahertz technology within reach. The product is
scheduled to ship in October 2013.

New Platform Expands the Frontiers of Terahertz Research

Terahertz technology is a pioneering approach to measurement and analysis that
has drawn attention and investment across a range of fields. Because
substances reflect or absorb terahertz radiation differently, according to
their unique fingerprint spectra, it is ideal for spectroscopic analysis and
non-invasive imaging applications. Advantest launched its first terahertz
analysis system—the TAS7000 3D imaging analysis system—in April 2010, and now
leads the industry in practical applications for terahertz technology, with a
line-up of non-invasive analysis systems targeting various markets, such as
pharmaceutical products.

Meanwhile, cutting-edge research employs terahertz analysis technology in
combination with other lab equipment, such as cryostats and heaters, in the
development of new materials and physical analysis. Laboratories require
measurement equipment that is both highly accurate and easy to use.
Advantest’s new terahertz wave spectroscopy and imaging analysis platform
meets these requirements, and is positioned to help researchers make gains in
accuracy and R&D efficiency.

Featuring terahertz source and detector modules connected to the mainframe by
optical fiber cables, the new platform enables free layout of the area to be
measured. The platform may also be connected to other lab equipment,
supporting a broad variety of R&D projects utilizing terahertz radiation.

With this new product, Advantest confirms its position at the forefront of
applied terahertz technology and R&D.

* The terahertz frequency spans 0.1 - 10THz on the electromagnetic spectrum.

Configuration and Key Features

The new platform comprises a terahertz optical sampling system, three
terahertz source modules, and a terahertz detector module.

TAS7500TS Terahertz Optical Sampling System

A desktop-size tool with laser pulse generation and signal analysis
functionality. The TAS7500TS’s high-speed scanning function (1 millisecond per
scan) relies on technology independently developed by Advantest. Additionally,
its phase-modulated dual-laser-synchronized technology enables differential

* Basic configuration includes single-laser-pulse generation. Dual-pulse
functionality is available as an option.

TAS1110, TAS1120, TAS1130 Terahertz Source Modules
TAS1230 Terahertz Detector Module

Source modules convert laser pulses into terahertz waves. A separate module is
available for each of three wavebands: the TAS1110 for 0.1~4THz(basic type),
the TAS1120 for 0.03~2THz(low-frequency type), and the TAS1130 for 0.5~7THz
(broadband type), with the TAS1130 possessing superior bandwidth coverage
and spectral flatness.

The detector module samples the waves that are reflected by or pass through
the sample under measurement. Each module is connected to the TAS7500TS by a
1.5 meter optical fiber cable, eliminating the need for complex adjustments,
and enabling users to position the modules flexibly for best alignment with

Further Inquiries

TAS Project


About Advantest Corporation

A world-class technology company, Advantest is the leading producer of
automatic test equipment (ATE) for the semiconductor industry and a premier
manufacturer of measuring instruments used in the design and production of
electronic instruments and systems. Its leading-edge systems and products are
integrated into the most advanced semiconductor production lines in the world.
The company also focuses on R&D for emerging markets that benefit from
advancements in nanotech and terahertz technologies, and has recently
introduced multi-vision metrology scanning electron microscopes essential to
photomask manufacturing, as well as a groundbreaking 3D imaging and analysis
tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in
1982, in the USA, and now has subsidiaries worldwide. More information is
available at

All information supplied in this release is correct at the time of
publication, but may be subject to change.


Advantest Corporation
Hiroki Yanagita, +81-3-3214-7500
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