Aehr Test Systems Announces First Production Orders for Next-Generation FOX(TM) Semiconductor Test Systems

Aehr Test Systems Announces First Production Orders for Next-Generation
FOX(TM) Semiconductor Test Systems

FREMONT, Calif., May 30, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, announced today that it has received an order totaling nearly $2
million, with a 30% down payment, for multiple production systems of its
next-generation FOX Semiconductor Test System from a leading manufacturer of
flash memory devices. The systems are expected to ship in the first half of
calendar 2014.

"This order for FOX-1Ps is the first order of what we believe will lead to
multiple follow-on systems as our customer ramps capacity in several of their
facilities worldwide," said Gayn Erickson president and chief executive
officer at Aehr Test Systems. "They are a great lead customer for this new
product, and we have already garnered additional interest from several other
customers looking at our new FOX-1P for production functional test, wafer
level burn-in and process monitor applications.

"There is a lot of interest in our highly-parallel FOX test solutions from IC
manufacturers around the world, especially those who are implementing built-in
self-test (BIST) and design-for-testability (DFT) features into their
products," continued Erickson. "We believe that our FOX family of single and
multiple wafer test systems represents a significant breakthrough in meeting
the continuous cost of test reductions needed as customers achieve full wafer
test. With our unique architecture which allows thousands of individual device
power supplies (DPS), 10x or more than other ATE systems, as well as all
input/output (I/O), with per pin resources, we are able to address the
specific test challenges required by low pin count DFT and BIST modes of the
latest logic and memory devices such as microcontrollers, smart cards and
flash memory devices."

The next generation FOX-1P extends the capabilities of the Aehr Test FOX-1 by
adding high density, low cost I/O and DPS modules with the capability to
provide over 16,000 I/O or DPS channels in a single test head for massive
parallelism on a single wafer. It has resources to test over 10,000 die on a
single wafer with individual DPS channels. Each channel has current monitoring
and provides protection of the device and the probe cards that connect the
test system to the devices under test.

Aehr Test's FOX family of products is focused on full wafer high reliability
test and sort test needs for products such as automotive ICs, memories and
devices with embedded memories, including microcontrollers and smart cards.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS^TM and FOX families of test and burn-in systems
and the DiePakĀ® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit Aehr Test's website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and acceptance
of Aehr Test's products. Actual results may vary from projected results. These
risks and uncertainties include, without limitation, acceptance by customers
of the FOX technologies, acceptance by customers of the FOX systems shipped
upon receipt of a purchase order and the ability of new products to meet
customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and
other reports from time to time filed with the Securities and Exchange
Commission for a more detailed description of the risks facing our business.
Aehr Test disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances occurring after
the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
 
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