Cascade Microtech Goes Global With CONNECT 2013

Cascade Microtech Goes Global With CONNECT 2013 
International Event Highlights New Wafer Probing Solutions Addressing
Emerging Test and Measurement Challenges 
BEAVERTON, OR -- (Marketwired) -- 05/20/13 --  Cascade Microtech,
Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of
integrated circuits at the wafer level, today announced the kickoff
of its series of CONNECT events. In this series of local events
beginning in San Jose, CA and travelling throughout Europe, Asia and
Japan, CONNECT will feature the company's newest wafer probing
solutions and will provide a forum for discussing the most current
challenges facing device and process design engineers and
manufacturers today. 
CONNECT is being launched as a platform for communication and sharing
of ideas, challenges and best-practice solutions; it is Cascade
Microtech's belief that the information that drives discovery and
innovation is the accumulated knowledge of its industry peers. During
the course of CONNECT's global tour, attendees will meet the
innovative team of design engineers, technical managers and
executives who created its newest wafer probing solutions to enable
customers to meet evolving test challenges. Two specific areas will
be highlighted; high-power device production probing and process
characterization/modeling. Cascade Microtech has recently introduced
new solutions that address these challenges. 
In separate seminars targeted at process development and production
test engineers, the CONNECT agenda will address the market outlook as
well as introduce Cascade Microtech's response to the industry
challenges. For on-wafer power device probing, the company's
APS200TESLA fully-automated on-wafer probe system will be presented,
underscoring the importance of its unique capabilities to provide a
safe and high-performance production test environment for
high-voltage/high-current applications. Rated up to 10.5kV DC/400 A,
Cascade Microtech's APS200TESLA is the first fully-automated on-wafer
probe system to offer unmatched electrical performance for
high-current/high-voltage probing of power devices in a production
environment. The probe system features a high-voltage/high-power
chuck port, and the patent-pending MicroVac(TM) chuck that can handle
wafer thicknesses down to 50 um, including the ultra-thin Taiko
wafers. The APS200TESLA enables high-power device manufacturers to
achieve better yields and deliver superior cost of test.  
Another new product we will highlight is the new CM300. Delivering
high integrity data, the CM300 is a semi-/fully-automated 300 mm
probe system for device and process characterization and modeling.
The CM300 is a flexible on-wafer measurement platform that scales to
meet evolving needs in capability and automation. It enhances device
and process characterization and modeling by capturing the true
electrical performance of devices and enabling hands-off
productivity. Its high-accuracy performance enables minimization of
design iterations, delivering reliable data, reducing costs and
speeding time-to-market. 
"We are excited to be launching the first CONNECT series, which will
bring Cascade Microtech's innovators and leaders closer to the
semiconductor process and production test engineers who face
escalating demands to produce more data, and to deliver products to
market, faster than ever before," said Debbora Ahlgren, Vice
President, Marketing. "This is a great opportunity for us to learn
from the folks on the cutting edge who are reacting to the market
drivers forcing changes in process technology. As a result, we can
put our innovative resources to work helping them overcome challenges
to test and measurement." 
As a continuation of Cascade Microtech's focus on knowledge exchange,
we will be hosting the first Cascade Microtech user meeting, COMPASS,
on September 9th in Anaheim. Look for information on the company's
For full details and registration information on CONNECT, visit  
About Cascade Microtech, Inc. 
 Cascade Microtech, Inc. (NASDAQ:
CSCD) is a worldwide leader in precision contact, electrical
measurement and test of integrated circuits (ICs), optical devices
and other small structures. For technology businesses and scientific
institutions that need to evaluate small structures, Cascade
Microtech delivers access to electrical data from wafers, ICs, IC
packages, circuit boards and modules, MEMS, 3D TSV, LED devices and
more. Cascade Microtech's leading-edge stations, probes, probe cards
and integrated systems deliver precision accuracy and superior
performance both in the lab and during production manufacturing of
high-speed and high-density semiconductor chips. For more information
Debbora Ahlgren
Cascade Microtech, Inc.
(503) 601-1934 
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