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Aehr Test Systems Announces Follow-On FOX(TM)-1 Parallel Test System and WaferPak(TM) Contactor Orders



Aehr Test Systems Announces Follow-On FOX(TM)-1 Parallel Test System and
WaferPak(TM) Contactor Orders

FREMONT, Calif., May 6, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, announced today that it has received over $4 million in follow-on
orders for multiple FOX-1 Parallel Test Systems and WaferPak contactors from a
leading manufacturer of semiconductor memory devices. The orders include 30%
down payments to lock in deliveries and a volume pricing agreement.

"We are very pleased to have received these follow-on orders," said Gayn
Erickson, president and chief executive officer at Aehr Test Systems. "The
orders indicate to us that our customer is achieving ongoing cost and
through-put benefits with the FOX full wafer contact solution.  Further, they
emphasize the close relationship that we have with our customer and their
continuing commitment to Aehr Test's products for their wafer sort needs."

The FOX systems, using Aehr Test WaferPak contactors, allow parallel testing
of thousands of die on a wafer with only a single touchdown. Aehr Test's FOX
family of products is focused on high reliability test needs and long-duration
full wafer burn-in and test of products such as automotive ICs, memories and
devices with embedded memories, including microcontrollers and smart card
devices.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test.  Aehr Test has developed and introduced several innovative
products, including the ABTS^TM and FOX families of test and burn-in systems
and the DiePak® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and acceptance
of Aehr Test's products. Actual results may vary from projected results. These
risks and uncertainties include, without limitation, acceptance by customers
of the FOX and WaferPak contactor technologies, acceptance by customers of the
WaferPak contactors shipped upon receipt of a purchase order and the ability
of new products to meet customer needs or perform as described. See Aehr
Test's recent 10-K, 10-Q and other reports from time to time filed with the
Securities and Exchange Commission for a more detailed description of the
risks facing our business. The Company disclaims any obligation to update
information contained in any forward-looking statement to reflect events or
circumstances occurring after the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
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