Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for Ultimate Products -- Test & Measurement Systems and Boards BEAVERTON, OR -- (Marketwire) -- 03/28/13 -- Cascade Microtech, Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of integrated circuits at the wafer level, today announced it has been named a finalist in UBM Tech's EE Times and EDN Annual Creativity in Electronics (ACE) Awards for Ultimate Products -- Test & Measurement Systems and Boards. The company's APS200TESLA fully-automated system for on-wafer power device probing was among the top five products to be named in this category. New and emerging applications in renewable energy and industrial power will challenge power device manufacturers to design and manufacture more efficient devices at a lower cost, driving the need for test solutions specifically targeted for high-voltage/high-current probing. Rated up to 10.5k V/400 A, Cascade Microtech's APS200TESLA is the first fully-automated on-wafer probe system to offer unmatched electrical performance for HI/HV probing of power devices in a production environment. The probe system comes with a high-voltage/high-current probe card, a high-voltage/high-power chuck port, and the patent-pending MicroVac(TM) high-power chuck that can handle wafer thicknesses down to 50 um, such as the ultra-thin Taiko wafers. An optimized electrical connection easily integrates the APS200TESLA with a variety of test instruments, and the interlock-enabled safety shield provides a regulatory-approved safe environment for the operator. The arc-suppression feature allows the customer to optimize device layout to achieve better yields and deliver superior cost of test. Auto-discharging and the unique probe-pin touch sensing capability prevent device damage due to high-voltage discharge during die-to-die moves. The APS200TESLA also offers advanced prober control software for automatic wafer and die stepping. "The new APS200TESLA leverages our experience in achieving accurate on-wafer measurement to provide an advanced power device measurement system that helps our customers increase test throughput," said Debbora Ahlgren, Vice President, Marketing, Cascade Microtech, Inc. "By enabling on-wafer production test, the APS200TESLA permits our customers to reduce their cost of test and ensures the safety of both devices and operators." The Annual Creativity in Electronics (ACE) Awards celebrate the creators of technology who demonstrate leadership and innovation in the global industry and shape the world we live in. Winners will be announced at the EE Times and EDN ACE Awards ceremony on April 23, 2013, as part of UBM Tech's DESIGN West and ESC Silicon Valley Conference. About Cascade Microtech, Inc. Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech's leading-edge stations, probes, probe cards and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit www.cascademicrotech.com. FOR MORE INFORMATION, CONTACT: Debbora Ahlgren Cascade Microtech, Inc. (503) 601-1829 Debbora.Ahlgren@cmicro.com
Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for Ultimate Products -- Test & Measurement Systems and
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