Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for Ultimate Products -- Test & Measurement Systems and

Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for 
Ultimate Products -- Test & Measurement Systems and Boards 
BEAVERTON, OR -- (Marketwire) -- 03/28/13 --  Cascade Microtech, Inc.
(NASDAQ: CSCD), a leader at enabling precision measurements of
integrated circuits at the wafer level, today announced it has been
named a finalist in UBM Tech's EE Times and EDN Annual Creativity in
Electronics (ACE) Awards for Ultimate Products -- Test & Measurement
Systems and Boards. The company's APS200TESLA fully-automated system
for on-wafer power device probing was among the top five products to
be named in this category. 
New and emerging applications in renewable energy and industrial
power will challenge power device manufacturers to design and
manufacture more efficient devices at a lower cost, driving the need
for test solutions specifically targeted for
high-voltage/high-current probing. Rated up to 10.5k V/400 A, Cascade
Microtech's APS200TESLA is the first fully-automated on-wafer probe
system to offer unmatched electrical performance for HI/HV probing of
power devices in a production environment. The probe system comes
with a high-voltage/high-current probe card, a
high-voltage/high-power chuck port, and the patent-pending
MicroVac(TM) high-power chuck that can handle wafer thicknesses down
to 50 um, such as the ultra-thin Taiko wafers. An optimized
electrical connection easily integrates the APS200TESLA with a
variety of test instruments, and the interlock-enabled safety shield
provides a regulatory-approved safe environment for the operator. The
arc-suppression feature allows the customer to optimize device layout
to achieve better yields and deliver superior cost of test.
Auto-discharging and the unique probe-pin touch sensing capability
prevent device damage due to high-voltage discharge during die-to-die
moves. The APS200TESLA also offers advanced prober control software
for automatic wafer and die stepping.  
"The new APS200TESLA leverages our experience in achieving accurate
on-wafer measurement to provide an advanced power device measurement
system that helps our customers increase test throughput," said
Debbora Ahlgren, Vice President, Marketing, Cascade Microtech, Inc.
"By enabling on-wafer production test, the APS200TESLA permits our
customers to reduce their cost of test and ensures the safety of both
devices and operators." 
The Annual Creativity in Electronics (ACE) Awards celebrate the
creators of technology who demonstrate leadership and innovation in
the global industry and shape the world we live in. Winners will be
announced at the EE Times and EDN ACE Awards ceremony on April 23,
2013, as part of UBM Tech's DESIGN West and ESC Silicon Valley
Conference. 
About Cascade Microtech, Inc. 
 Cascade Microtech, Inc. (NASDAQ:
CSCD) is a worldwide leader in precision contact, electrical
measurement and test of integrated circuits (ICs), optical devices
and other small structures. For technology businesses and scientific
institutions that need to evaluate small structures, Cascade
Microtech delivers access to electrical data from wafers, ICs, IC
packages, circuit boards and modules, MEMS, 3D TSV, LED devices and
more. Cascade Microtech's leading-edge stations, probes, probe cards
and integrated systems deliver precision accuracy and superior
performance both in the lab and during production manufacturing of
high-speed and high-density semiconductor chips. For more information
visit www.cascademicrotech.com. 
FOR MORE INFORMATION, CONTACT: 
Debbora Ahlgren
Cascade Microtech, Inc.
(503) 601-1829
Debbora.Ahlgren@cmicro.com 
 
 
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