Aehr Test Systems to Present at Stifel Nicolaus 2013 Technology Conference

Aehr Test Systems to Present at Stifel Nicolaus 2013 Technology Conference

FREMONT, Calif., Jan. 28, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, announced today that the Company's President and Chief Executive
Officer, Gayn Erickson will be presenting at the Stifel Nicolaus 2013
Technology Conference. The conference is being held February 5-7, 2013 at The
Ritz-Carlton Hotel in San Francisco. Aehr Test is scheduled to present at 1:00
p.m. PT on Thursday, February 7, 2013.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS ^ TM and FOX ^ TM families of test and burn-in
systems and the DiePakĀ® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.

CONTACT: Gary Larson
         Chief Financial Officer
         (510) 623-9400 x321