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Aehr Test Systems Announces $2 Million in Orders From Automotive IC Manufacturers

Aehr Test Systems Announces $2 Million in Orders From Automotive IC
Manufacturers

FREMONT, Calif., Nov. 26, 2012 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, today announced it has received over $2 million in follow-on
production orders for its burn-in and test systems from multiple leading
manufacturers of advanced logic integrated circuits (ICs) for automotive
applications.

"The follow-on orders show that the burn-in and test process using Aehr Test's
systems are cost effective for reliability screening of a wide range of ICs
for the automotive market," said Carl Buck, vice president of marketing at
Aehr Test Systems. "ICs used by the auto manufacturers need to meet strict
quality and reliability standards. Burn-in screening is an essential process
for meeting the 'zero parts per million' failure rate required by leading auto
manufacturers.

"The burn-in process is used both for production for complex devices and for
qualification for virtually all new automotive ICs," Buck continued. "A
typical HTOL (high temperature operating life) qualification stresses several
hundred devices at 125C to 150C for 1000 hours."

According to IC Insights, a leading semiconductor research company, IC usage
for automotive applications including engine control, navigation,
infotainment, communications, battery management and sensors is projected to
outpace the total IC market and have a compound annual growth rate over 20%
greater than the IC market as a whole for the next 5 years.

"We are seeing increasing capacity needs for our ABTS^TM products in both
production burn-in and device qualifications due to the growth in the
automotive and mobility markets," Buck concluded.

The ABTS family of products is based on a new hardware and software platform
that is designed to address not only today's devices, but also future devices
for many years to come. It can test and burn-in both logic and memory devices,
including resources for high pin-count devices and configurations for
high-power and low-power applications. The ABTS system can be configured with
up to 72 burn-in boards with up to 320 I/O channels each and 32M of test
vector memory per channel. The ABTS system is optimized for use with the
Sensata iSocket* Thermal Management Technology, which provides a scalable
cost-effective solution using individual device temperature control for ICs up
to 75 watts or more. Individual temperature control enables high-power devices
with a broad range of power dissipation to be burned-in simultaneously in a
single burn-in chamber while maintaining a precise device temperature. The
ABTS system also uses N+1 redundancy technology for many key components in the
system to maximize system uptime.

*iSocket is a trademark of Sensata Technologies, Inc.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS and FOX^TM families of test and burn-in systems
and the DiePakĀ® carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power and high-power
logic as well as all common types of memory devices. The FOX system is a full
wafer contact test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and acceptance
of Aehr Test's products. Actual results may vary from projected results. These
risks and uncertainties include, without limitation, acceptance by customers
of the ABTS technology, acceptance by customers of the ABTS systems shipped
upon receipt of a purchase order and the ability of new products to meet
customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and
other reports from time to time filed with the Securities and Exchange
Commission for a more detailed description of the risks facing our business.
The Company disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances occurring after
the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773