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Aehr Test Systems Announces Participation in International Test Conference



Aehr Test Systems Announces Participation in International Test Conference

FREMONT, Calif., Nov. 7, 2012 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in
equipment is participating this week in the International Test Conference in
Anaheim, CA.  Aehr is showcasing its FOX^TM full-wafer test system and its
ABTS^TM burn-in and test system for packaged parts in the exhibition from
November 6-8. Aehr is demonstrating the latest version of the ABTS system,
which features a per-pin architecture for increased flexibility in testing
state-of-the-art logic devices.

In addition, Gayn Erickson, CEO and President of Aehr Test, participated in
the Entrepreneurship in Test CEO Panel Discussion on Monday, November 5. The
panel discussed the reasons behind the success of several companies in the
Automatic Test Equipment (ATE) industry and the opportunities produced by
changes in integrated circuits for innovation today, focusing on simplifying
test development and lowering the cost of test.

The FOX-1 full wafer parallel test system has the capability to test thousands
of die in a single touchdown, thus providing a cost-effective solution for
devices with long test times such as flash and microcontrollers with embedded
flash.

The FOX-15 Burn-in and Test System provides cost effective test and high
reliability burn-in of up to 15 wafers in parallel for applications such as
automotive ICs, DRAMs, flash memory, sensors and VCSELs (laser diodes). The
FOX-15 system performs burn-in of bare die at the wafer level so that Known
Good Die (KGD) can be produced for stacked die and through silicon via (TSV)
applications.

The ABTS family of products is based on a new hardware and software
architecture that is designed to address not only today's devices, but also
future devices for many years to come. It can test and burn-in both logic and
memory devices, including resources for high pin-count devices and
configurations for high-power and low-power applications. The ABTS system can
be configured with up to 72 burn-in boards with up to 320 I/O channels each
and 32M of test vector memory per channel. The ABTS system is optimized for
use with the Sensata iSocket* Thermal Management Technology, which provides a
scalable cost-effective solution using individual device temperature control
for ICs up to 75 watts or more. Individual temperature control enables
high-power devices with a broad range of power dissipation to be burned-in
simultaneously in a single burn-in chamber while maintaining a precise device
temperature. The ABTS system also uses N+1 redundancy technology for many key
components in the system to maximize system uptime.

*iSocket is a trademark of Sensata Technologies, Inc.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test.  Aehr Test has developed and introduced several innovative
products, including the ABTS and FOX families of test and burn-in systems and
the DiePak® carrier. The ABTS system is used in production and qualification
testing of packaged parts for both low-power and high-power logic as well as
all common types of memory devices. The FOX system is a full wafer contact
test and burn-in system used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding revenues, net sales and
customer demand and acceptance of Aehr Test's products. Actual results may
vary from projected results. These risks and uncertainties include without
limitation, world economic conditions, the state of the semiconductor
equipment market, the Company's ability to maintain sufficient cash to support
operations, acceptance by customers of Aehr Test's technologies, acceptance by
customers of the systems shipped upon receipt of a purchase order, the ability
of new products to meet customer needs or perform as described and the
Company's ability to successfully market a wafer-level test and burn-in
system. See Aehr Test's recent 10-K, 10-Q and other reports from time to time
filed with the U.S. Securities and Exchange Commission for a more detailed
description of the risks facing our business. The Company disclaims any
obligation to update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this press
release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
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