Aehr Test Systems Announces Partnership With Alliance ATE Consulting Group

Aehr Test Systems Announces Partnership With Alliance ATE Consulting Group

FREMONT, Calif., Nov. 5, 2012 (GLOBE NEWSWIRE) -- Aehr Test Systems
(Nasdaq:AEHR),  a worldwide supplier of semiconductor test and burn-in
equipment, and AllianceATE Consulting Group (AllianceATE), a semiconductor
software and test services company, announced a partnership today to add
Alliance ATE's VelocityCAE software as an option to Aehr Test's ABTS^TM
advanced burn-in and test systems.

VelocityCAE is a test program, vector and timing generation tool suite
developed by AllianceATE. VelocityCAE takes EDA Simulation design files and
translates them into complete test programs for use on Aehr Test's ABTS
system.

"Our partnership with Aehr combines the design-to-test capabilities of
VelocityCAE with Aehr Test's burn-in technology to help meet the evolving
needs of semiconductor companies," said Bill Wymbs, CEO at AllianceATE. "We
believe that our expertise in both test program and vector translation
complements Aehr's state-of-the-art capabilities in the burn-in and test
market."

Test engineers typically use industry-standard WGL (Waveform Generation
Language) and STIL (Standard Test Interface Language) vector formats to run
tests on semiconductor devices during both product characterization and
production test. To increase test coverage and reduce time-to-market,
semiconductor companies are now using these same vector formats during the
burn-in process. VelocityCAE software from AllianceATE will convert WGL and
STIL vectors to run on Aehr Test's ABTS test and burn-in systems, making test
program development more efficient and decreasing time-to-market.

"Semiconductor companies are asking for more functional test capabilities both
during the burn-in stage with our ABTS system and in wafer sort with our FOX™
full-wafer test system," said Carl Buck, vice president of marketing at Aehr
Test Systems. "We are excited to be able to partner with AllianceATE to
provide our customers with a better way to generate both test vectors and test
programs so that they have a faster time to market. These capabilities are
increasingly important, as the latest ABTS system has a full functional test
sequencer backed by 32 million vectors to exercise the devices under test."

Aehr Test will also offer an advanced version of VelocityCAE to their
customers, which includes full automated test program generation from product
engineering spreadsheets, which will decrease time-to-market further.

The ABTS family of products is based on a new hardware and software
architecture that is designed to address not only today's devices, but also
future devices for many years to come. It can test and burn-in both logic and
memory devices, including resources for high pin-count devices and
configurations for high-power and low-power applications. The ABTS system can
be configured with up to 72 burn-in boards with up to 320 I/O channels each
and 32M of test vector memory per channel. The ABTS system is optimized for
use with the Sensata iSocket* Thermal Management Technology, which provides a
scalable cost-effective solution using individual device temperature control
for ICs up to 75 watts or more. Individual temperature control enables
high-power devices with a broad range of power dissipation to be burned-in
simultaneously in a single burn-in chamber while maintaining a precise device
temperature. The ABTS system also uses N+1 redundancy technology for many key
components in the system to maximize system uptime.

*iSocket is a trademark of Sensata Technologies, Inc.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in package and wafer
level test. Aehr Test has developed and introduced several innovative
products, including the ABTS and FOX families of test and burn-in systems and
the DiePak® carrier. The ABTS system is used in production and qualification
testing of packaged parts for both low-power and high-power logic as well as
all common types of memory devices. The FOX system is a full wafer contact
test and burn-in system used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is
a reusable, temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more information,
please visit the Company's website at www.aehr.com.

About Alliance ATE Consulting Group

Based in the heart of Silicon Valley, AllianceATE Consulting Group, Inc is a
semiconductor software and test services company that automates the
design-to-test processes. Alliance ATE can deliver turnkey production test
solutions targeted at a variety of test platforms and contract
manufacturers.VelocityCAE software was developed by AllianceATE to reduce
time-to-market of complex semiconductor device test solutions while reducing
test development cost by orders of magnitude. For more information visit
www.allianceate.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and acceptance
of Aehr Test's products.Actual results may vary from projected results.These
risks and uncertainties include, without limitation, acceptance by customers
of the ABTS technology, acceptance by customers of the ABTS systems shipped
upon receipt of a purchase order and the ability of new products to meet
customer needs or perform as described.See Aehr Test's recent 10-K, 10-Q and
other reports from time to time filed with the Securities and Exchange
Commission for a more detailed description of the risks facing our
business.The Company disclaims any obligation to update information contained
in any forward-looking statement to reflect events or circumstances occurring
after the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. of Marketing
         (510) 623-9400 x381
        
         Financial Relations Board
         Marilynn Meek
         Analyst/Investor Contact
         (212) 827-3773
        
         Alliance ATE Consulting Group
         William Wymbs
         CEO
         (408) 230-9711